ASTM-E2859 2011

$40.63

E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

Published By	Publication Date	Number of Pages
ASTM	2011	9

Guaranteed Safe Checkout

Category: ASTM

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

ASTM E2859-11

Historical Standard: Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

ASTM E2859

Scope

1.1 The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike electron microscopy, which provides a two-dimensional projection or a two-dimensional image of a sample, AFM provides a three-dimensional surface profile. While the lateral dimensions are influenced by the shape of the probe, displacement measurements can provide the height of nanoparticles with a high degree of accuracy and precision. If the particles are assumed to be spherical, the height measurement corresponds to the diameter of the particle. In this guide, procedures are described for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM. Generic procedures for AFM calibration and operation to make such measurements are then discussed. Finally, procedures for data analysis and reporting are addressed. The nanoparticles used to exemplify these procedures are National Institute of Standards and Technology (NIST) reference materials containing citrate-stabilized negatively charged gold nanoparticles in an aqueous solution.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

atomic force microscope; AFM; calibration; cantilever de&fllig;ection; contact mode; functionalized substrate; gold nanoparticle; height displacement; intermittent mode; nanoparticle; nanoscale measurement; particle deposition; particle size; tapping mode

ICS Code

ICS Number Code 07.120 (Nanotechnologies)

DOI: 10.1520/E2859-11

PDF Catalog

PDF Pages	PDF Title
1	Scope Referenced Documents Terminology
2	Summary of Practice FIG. 1
3	Significance and Use Reagents Apparatus Procedure
5	FIG. 2
7	Report FIG. 3
8	Keywords REFERENCES FIG. 4

Additional information

Standard Title	E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Published Code	ASTM
Publication Date	2011
Pages Count	9