ASTM-F77 1996

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F77-69(1996) Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)

Published By	Publication Date	Number of Pages
ASTM	1996	3

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Description

ASTM F77-69-Reapproved1996

Withdrawn Standard: Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)

ASTM F77

Scope

1.1 This test method covers the determination of the apparent density of ceramic parts, used in electron device and semiconductor applications, with a maximum dimension of 25 mm (1 in.) and having zero or discontinuous porosity.

1.2 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability or regulatory limitations prior to use.

Keywords

Ceramic materials-electrical/electronic devices; Density-electronic applications; Electronic materials/applications-ceramics; apparent density of ceramics (for electron device/semiconductor; application)

ICS Code

ICS Number Code 29.045 (Semiconducting materials)

DOI: 10.1520/F0077-69R96

Additional information

Standard Title	F77-69(1996) Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
Published Code	ASTM
Publication Date	1996
Pages Count	3