BS EN 60512-27-100:2012
$198.66
Connectors for electronic equipment. Tests and measurements – Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors. Tests 27a to 27g
Published By | Publication Date | Number of Pages |
BSI | 2012 | 70 |
IEC 60512-27-100:2011 specifies the test methods for transmission performance for IEC 60603-7 series connectors up to 500 MHz. It is also suitable for testing lower frequency connectors if they meet the requirements of the detail specifications and of this standard. The test methods provided are: – insertion loss, – return loss, – near-end crosstalk (NEXT), – far-end crosstalk (FEXT), – transverse conversion loss (TCL) and – transverse conversion transfer loss (TCTL). For the transfer impedance (Zt) test, see IEC 60512-26-100 and for the coupling attenuation, see IEC 62153-4-12.
PDF Catalog
PDF Pages | PDF Title |
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6 | English CONTENTS |
10 | 1 Scope and object 2 Normative references |
11 | 3 Terms, definitions, acronyms and symbols 3.1 Terms and definitions 3.2 Acronyms |
12 | 3.3 Symbols 4 Overall test arrangement 4.1 Test instrumentation |
13 | 4.2 Coaxial cables and interconnect for network analysers 4.3 Measurement precautions 4.4 Balun requirements Figures Figure 1 – Optional 180° hybrid used as a balun |
14 | 4.5 Interfacing Tables Table 1 – Test balun performance characteristics |
15 | 4.6 Reference components for calibration Figure 2 – Measurement configurations for test balun qualification |
16 | 4.7 Termination loads for termination of conductor pairs Figure 3 – Calibration of reference loads Figure 4 – Resistor termination networks |
17 | 4.8 Termination of screens 4.9 Test specimen and reference planes |
18 | Figure 5 – Definition of reference planes |
19 | 5 Connector measurement up to 500 MHz 5.1 General 5.2 Insertion loss, Test 27a Table 2 – Interconnection return loss |
20 | Figure 6 – Measuring set-up |
21 | 5.3 Return loss, Test 27b |
22 | 5.4 Near-end crosstalk (NEXT), Test 27c Table 3 – Uncertainty band of return loss measurement at frequencies below 100 MHz Table 4 – Uncertainty band of return loss measurement at frequencies above 100 MHz |
23 | Figure 7 – Example for NEXT measurements |
25 | Table 5a – Free connector TFC NEXT loss limit vectors for connectors specified up to 100 MHz Table 5b – Free connector TFC NEXT loss limit vectors for connectors specified from 1 MHz to 250 MHz and from 1 MHz to 500 MHz |
26 | 5.5 Far-end crosstalk (FEXT), Test 27d Table 6 – Connecting hardware NEXT loss for Case 1 and Case 4 |
27 | Figure 8 – Example for FEXT measurements for DM and CM terminations |
28 | 5.6 Transfer impedance (Zt) 5.7 Transverse conversion loss (TCL), Test 27f |
29 | Figure 9 – Example of TCL measurement |
30 | Figure 10 – Coaxial lead attenuation calibration Figure 11 – Back-to-back balun insertion loss measurement |
31 | Figure 12 – Configuration for balun CM insertion loss calibration Figure 13 – Schematic for balun CM insertion loss calibration |
32 | 5.8 Transverse conversion transfer loss (TCTL), Test 27g |
33 | Figure 14 – Example of TCTL measurement |
34 | 5.9 Coupling attenuation 6 Construction and qualification of TFCs for NEXT, FEXT and return loss measurements 6.1 General |
35 | Figure 15 – Calibration and interface planes and port extensions |
37 | Figure 16 – Examples of direct fixture short, open, load, and through artefacts |
38 | 6.2 TFC near-end crosstalk (NEXT) Figure 17 – Modular free connector placed into the free connector clamp |
39 | Figure 18 – Guiding the free connector into position Figure 19 – TFC direct fixture |
40 | Figure 20 – illustration of TFC NEXT measurement in the forward direction |
41 | 6.3 TFC far-end crosstalk (FEXT) Table 7 – TFC NEXT loss ranges |
42 | 6.4 TFC return loss Table 8 – TFC FEXT loss ranges |
44 | Figure 21 – Example of suitable return loss deembedding reference socket Table 9 – De-embedding return loss reference fixed connector assembly standard vectors |
45 | Figure 22 – Flow chart for determination of reference fixed connector S-parameters Figure 23 – Representation of a mated connection by two cascaded networks |
46 | Figure 24 – Return loss deembedding reference plug terminated with LOAD resistors Figure 25 – Return loss test plug calibration and interface planes |
48 | Figure 26 – Flow chart of determination of return loss test plug properties |
49 | 6.5 Test fixtures for TFC testing Figure 27 – Direct fixture mating dimensions A Table 10 – Return loss requirements for TFCs |
50 | Figure 28 – Direct fixture mating dimensions B Figure 29 – Direct fixture mating dimension C Table 11 – Direct fixture performance |
51 | Annex A (informative) Impedance controlled measurement fixture Figure A.1 – Test head assembly with baluns attached |
52 | Figure A.2 – Test balun interface pattern |
53 | Figure A.4 – Test head assembly showing shielding between baluns |
54 | Figure A.5 – Balun test 2 fixture assembly |
55 | Figure A.6 – Free connector direct fixture, DPMF-2 view 1 Figure A.7 – Free connector direct fixture, DPMF-2 view 2 |
56 | Figure A.8 – Exploded assembly of the direct fixture |
57 | Figure A.9 – PCB based free connector Figure A.10 – TP6A PCB based free connector assembly with adapter |
58 | Figure A.11 – An example of a connecting hardware measurement configuration |
59 | Figure A.12 – Test fixture interface Figure A.13 – Open calibration standard applied to test interface |
60 | Figure A.14 – Short calibration standard applied to test interface Figure A.15 – Load calibration standard applied to test interface |
61 | Figure A.16 – Back-to-back through standard applied to test interface Figure A.17 – TFC attached to the test interface |
62 | Figure A.18 – Direct fixture mounted to the test head interface Figure A.19 – Calibration plane |
63 | Figure A.20 – Through calibration Figure A.21 – Test setup for twisted-pair return 2 loss measurement |
64 | Figure A.22 – Method to minimize distance between planes |
65 | Annex B (normative) Termination of balun Figure B.1 – Balanced attenuator for balun centre tap grounded |
66 | Figure B.2 – Balanced attenuator for balun centre tap open |
67 | Bibliography |