BS EN 61000-4-22:2011
$198.66
Electromagnetic compatibility (EMC) – Testing and measurement techniques. Radiated emission and immunity measurements in fully anechoic rooms (FARs)
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 54 |
IEC 61000-4-22:2010 considers immunity tests and emission measurements for electric and/or electronic equipment. Only radiated phenomena are considered. It establishes the required test procedures for using fully anechoic rooms for performing radiated immunity testing and radiated emission measurements. IEC 61000-4-22:2010 establishes a common validation procedure, equipment under test (EUT) set-up requirements, and measurement methods for fully anechoic rooms (FARs) when both radiated electromagnetic emission measurements and radiated electromagnetic immunity tests will be performed in the same FAR. As a basic measurement standard, this part of IEC 61000 does not intend to specify the test levels or emission limits to be applied to particular apparatus or system(s). Its main goal is to provide general measurement procedures to all concerned product committees of IEC or CISPR. Specific product requirements and test conditions are defined by the responsible product committees. The methods described in this standard are appropriate for radiated emission measurements and immunity tests in the frequency range of 30 MHz to 18 GHz. IEC 61000-4-22:2010 has the status of a basic EMC publication in accordance with IEC Guide 107, Electromagnetic compatibility – Guide to the drafting of electromagnetic compatibility publications.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 8 | INTRODUCTION |
| 10 | 1 Scope 2 Normative references |
| 11 | 3 Terms and definitions |
| 12 | 4 FAR applications 4.1 Measurand for radiated immunity testing |
| 13 | 4.2 Measurand for radiated emission measurements 5 FAR validation/calibration procedure 5.1 General 5.2 Validation set-ups |
| 14 | Figures Figure 1 – Type 1 validation block diagramme Figure 2 – Type 2 validation block diagramme |
| 15 | Figure 3 – Type 3 validation block diagramme Figure 4 – Type 4 validation block diagramme |
| 17 | 5.3 Test facility description Tables Table 1 – Components required for the different validation set-up types |
| 18 | 5.4 Definition of quantities to be determined by the FAR validation procedure |
| 19 | 5.5 Required sampling positions for FAR validation |
| 20 | 5.6 FAR validation procedure Figure 5 – Locations of the sampling points for FAR validation |
| 22 | 5.7 Validation requirement |
| 23 | 6 Test set-up Table 2 – Validation criteria |
| 25 | Figure 6 – Example test set-up for table-top equipment |
| 26 | Figure 7 – Example test set-up for table-top equipment, top view Figure 8 – Example test set-up for floor-standing equipment |
| 27 | Figure 9 – Example test set-up for floor-standing equipment, top view |
| 28 | Annex A (normative) Radiated immunity tests |
| 30 | Figure A.1 – Definition of dmeasurement for immunity tests |
| 33 | Annex B (normative) Radiated emission measurements |
| 34 | Figure B.1 – Definition of dmeasurement for emission measurements |
| 36 | Annex C (informative) Background on the system transducer factor and simultaneous emissions/immunity validation method |
| 39 | Annex D (informative) Measurement uncertainties Figure D.1 – Example of influence factors for emission measurements |
| 40 | Table D.1 – Measurement instrumentation uncertainty in a FAR for radiated emission measurements in the frequency range 30 MHz to 1 000 MHz |
| 41 | Table D.2 – Measurement instrumentation uncertainty in a FAR for radiated emission measurements in the frequency range 1 GHz to 18 GHz |
| 46 | Figure D.2 – Example of influences upon the immunity test method |
| 47 | Table D.3 – Measurement instrumentation uncertainty in a FAR for level setting for immunity testing in the frequency range 30 MHz to 1 000 MHz |
| 48 | Table D.4 – Measurement instrumentation uncertainty in a FAR for level setting for immunity testing in the frequency range 1 GHz to 18 GHz |
| 52 | Bibliography |
