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BS EN IEC 61000-4-20:2022

BS EN IEC 61000-4-20:2022

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Electromagnetic compatibility (EMC) – Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides

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BSI 2022 120
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PDF Pages PDF Title
2 undefined
5 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
6 Blank Page
7 English
CONTENTS
12 FOREWORD
14 INTRODUCTION
15 1 Scope
16 2 Normative references
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
19 3.2 Abbreviated terms
20 4 General
5 TEM waveguide requirements
5.1 General
21 5.2 General requirements for the use of TEM waveguides
5.2.1 Test volume and maximum EUT size
5.2.2 Validation of usable test volume
23 Tables
Table 1 ā€“ Values k for expanded uncertainty with normal distribution
28 5.3 Special requirements and recommendations for certain types of TEM waveguides
5.3.1 Set-up of open TEM waveguides
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide
5.3.3 TEM mode generation for a four-port TEM waveguide
29 5.4 Figures for Clause 5
Figures
Figure 1 ā€“ Flowchart of TEM mode and field uniformity verification procedurewith the ā€œconstant forward powerā€ method (see 5.2.2.4.1)
30 Figure 2 ā€“ Flowchart of TEM mode and field uniformity verification procedurewith the ā€œconstant field strengthā€ method (see 5.2.2.4.2)
31 6 Overview of EUT types
6.1 General
6.2 Small EUT
6.3 Large EUT
7 Laboratory test conditions
7.1 General
7.2 Climatic conditions
7.3 Electromagnetic conditions
32 8 Evaluation and reporting of test results
33 Annex A (normative)Emission measurements in TEM waveguides
A.1 Overview
A.2 Test equipment
A.3 Correlating TEM waveguide voltages to electric field strength data
A.3.1 General
34 A.3.2 Correlation algorithms
38 A.4 Emission measurement correction factors
A.4.1 Reference emission sources
39 A.4.2 Arrangement of small EUTs
A.4.3 Calculation of the small EUT correction factor
42 A.5 Emission measurement procedures in TEM waveguides
A.5.1 EUT types
A.5.2 EUT arrangement
43 A.6 Test report
44 A.7 Figures for Annex A
Figure A.1 ā€“ Routing the exit cable to the corner at the ortho-angleand the lower edge of the test volume in a TEM waveguide (see A.5.2)
45 Figure A.2 ā€“ Basic ortho-axis EUT positioner or manipulator(see 3.1.13, A.4.2, A.5.1.2, A.5.2)
46 Figure A.3 ā€“ Die pattern and axis alignment for an EUT [26] (see A.3.2.3.2)
47 Figure A.4 ā€“ Non-redundant twelve-face and axis orientationsfor a typical EUT [26] (see A.3.2.3.2)
48 Figure A.5 ā€“ Open-area test site (OATS) emission measurements geometry (see A.3.2.4)
49 Annex B (normative)Immunity testing in TEM waveguides
B.1 Overview
B.2 Test equipment
B.2.1 General
B.2.2 Description of the test facility
50 B.3 Field uniformity area calibration
B.4 Test levels
B.5 Test set-up
B.5.1 Arrangement of table-top equipment
Table B.1 ā€“ Uniform area calibration points
Table B.2 ā€“ Test levels
51 B.5.2 Arrangement of floor-standing equipment
B.5.3 Arrangement of wiring
B.6 Test procedures
B.7 Test results and test report
52 B.8 Figures for Annex B
Figure B.1 ā€“ Example of test set-up for single-polarization TEM waveguide(see Clause B.5)
53 Figure B.2 ā€“ Uniform area calibration points in a TEM waveguide (see Clause B.3)
54 Annex C (normative)HEMP transient testing in TEM waveguides
C.1 Overview
C.2 Immunity tests
C.2.1 General
55 C.2.2 Radiated test facilities
Table C.1 ā€“ Radiated immunity test levels definedfor this document
56 C.2.3 Frequency domain spectrum requirements
C.3 Test equipment
57 C.4 Test set-up
C.5 Test procedure
C.5.1 General
58 C.5.2 Severity level and test exposures
C.5.3 Test procedure
59 C.5.4 Test execution
C.5.5 Execution of the radiated immunity test
60 C.6 Figure for Annex C
Figure C.1 ā€“ Pulse waveform frequency domain spectral magnitudebetween 100 kHz and 300 MHz (see C.2.1)
61 Annex D (informative)TEM waveguide characterization
D.1 Overview
D.2 Distinction between wave impedance and characteristic impedance
62 D.3 TEM wave
D.3.1 General
D.3.2 Free-space TEM mode
D.3.3 Waveguides
63 D.4 Wave propagation
D.4.1 General
D.4.2 Spherical propagation
D.4.3 Plane wave propagation in free space
D.4.4 Velocity of propagation
D.5 Polarization
64 D.6 Types of TEM waveguides
D.6.1 General
65 D.6.2 Open TEM waveguides (striplines, etc.)
D.6.3 Closed TEM waveguides (TEM cells)
D.7 Frequency limitations
66 D.8 Figures for Annex D
Figure D.1 ā€“ Simple waveguide (no TEM mode) (see D.3.3)
Figure D.2 ā€“ Example of waveguides supporting TEM-mode propagation (see D.3.3)
Figure D.3 ā€“ E-field polarization vector (see Clause D.5)
67 Figure D.4 ā€“ Simple transmission line model for TEM mode propagation (see D.6.1)
Figure D.5 ā€“ One- and two-port TEM waveguide concepts (see D.6.1)
Figure D.6 ā€“ Operation of four-port TEM waveguides (see D.6.1)
68 Figure D.7 ā€“ Two-port TEM cell (symmetric septum) (see D.6.1 and D.6.3)
69 Figure D.8 ā€“ One-port TEM cell (asymmetric septum) (see D.6.1 and D.6.3)
71 Figure D.9 ā€“ Stripline (two plates) (see D.6.1 and D.6.2)
72 Figure D.10 ā€“ Stripline (four plates, balanced feed) (see D.6.1)
73 Figure D.11 ā€“ Four-port TEM waveguide (symmetric parallel septa) (see D.6.1 and D.6.3)
74 Annex E (informative)Calibration method for E-field probes in TEM waveguides
E.1 Overview
E.2 Probe calibration requirements
E.2.1 General
E.2.2 Calibration frequency range
75 E.2.3 Calibration volume
E.2.4 Probe dimensions
E.2.5 Perturbations of TEM waveguide fields due to the probe
76 E.2.6 Frequency steps
E.2.7 Field strength
E.3 Requirements for calibration instrumentation
E.3.1 Specifications of TEM waveguide
Table E.1 ā€“ Calibration frequencies
Table E.2 ā€“ Calibration field strength level
77 E.3.2 Harmonics and spurious signals
E.3.3 Probe fixture
E.3.4 Measuring net power to a transmitting device using directional couplers
78 E.4 E-field probe calibration
E.4.1 Calibration methods
E.4.2 Calibration procedure using a two-port TEM waveguide
79 E.4.3 Calibration procedure using one-port TEM waveguide
82 E.5 Figures for Annex E
Figure E.1 ā€“ Example of test points for calibration volume validation (see E.2.3)
Figure E.2 ā€“ Set-up for validation of probe perturbation (see E.2.5)
Figure E.3 ā€“ Set-up for measuring net power toa transmitting device (not to scale) (see E.3.4)
83 Figure E.4 ā€“ Example set-up for E-field probecalibration with two-port TEM waveguide (see E.4.2)
Figure E.5 ā€“ Example set-up for E-field probe calibration withone-port TEM waveguide and alternative method (see E.4.3.2)
Figure E.6 ā€“ Equivalent circuit of monopole antennaand measuring apparatus (see E.4.3.3)
84 Annex F (informative)Instrumentation uncertainty of emission measurement results
F.1 Radiated disturbance measurements using a TEM waveguide
F.1.1 Measurand for radiated disturbance measurements using a TEM waveguide
F.1.2 Symbols of input quantities common to all disturbance measurements
F.1.3 Symbols of input quantities specific to TEM waveguide measurements
F.2 Input quantities to be considered for radiated disturbance measurements using a TEM waveguide
85 F.3 Uncertainty budget and rationale for the input quantities for radiated disturbance measurements using a TEM waveguide
F.3.1 Uncertainty budget for radiated disturbance measurements using a TEM waveguide
Table F.1 ā€“ Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 30 MHz to 1 000 MHz (example)
86 F.3.2 Rationale for the estimates of input quantities for radiated disturbance measurements using a TEM waveguide
Table F.2 ā€“ Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 1 GHz to 6 GHz (example)
88 Table F.3 ā€“ Values of Slim for 30 MHz to 1 000 MHz
89 Table F.4 ā€“ Values of Slim for 1 GHz to 6 GHz
92 F.4 Figures for Annex F
Figure F.1 ā€“ Deviation of the QP detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz
93 Figure F.2 ā€“ Deviation of the peak detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz
94 Annex G (informative)Measurement uncertainty of immunity testingdue to test instrumentation
G.1 General symbols
G.2 Symbol and definition of the measurand
G.3 Symbols for input quantities
G.4 Example: Uncertainty budget for immunity test
95 G.5 Rationale for the estimates of input quantities
Table G.1 ā€“ Example uncertainty budget of the immunity test level
98 Annex H (informative)Correlation of emission and immunity limitsbetween EMC test facilities
H.1 Overview
H.2 Dipole in free space (representing FAR set-up)
100 H.3 Dipole in half space (representing OATS or SAC set-up)
101 H.4 Dipole in a TEM-mode transmission line
102 H.5 Dipole in a reverberation chamber
103 H.6 Correlation
104 H.7 Example of emission limits
Table H.1 ā€“ Summary of the emission correlation parameters
105 H.8 Figures for Annex H
Figure H.1 ā€“ Representation of a short centre-fed dipole anda more general source representing an EUT (see Clause H.2)
Figure H.2 ā€“ Vertical source and receiving dipoles located overa perfectly-conducting ground plane of infinite extent (see Clause H.3)
106 Figure H.3 ā€“ Two types of TEM cells with a vertically polarized dipole sourceand the source to receive port geometry defined (see Clause H.4)
Figure H.4 ā€“ Reverberation chamber with a source dipole, a stirrer torandomize the fields, and a general receive antenna (see Clause H.5)
107 Figure H.5 ā€“ TEM waveguide Class A and Class B emission limits correlatedfrom CISPR 32 [68] (see Clause H.7)
108 Annex I (informative)TEM waveguide transient characterization
I.1 Overview
I.2 Test equipment
I.3 Test set-up
109 I.4 TEM waveguide characterization by correlation
110 I.5 Quantification of the Pcc
I.6 Performable transient test signals
111 I.7 Figures for Annex I
Figure I.1 ā€“ Test set-up
112 Figure I.2 ā€“ Signal windowing
Figure I.3 ā€“ Example of a heatmap ā€“ Pcc for a test point in the uniform area
113 Bibliography

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