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BS EN IEC 61726:2022 – TC

BS EN IEC 61726:2022 – TC

$186.33

Tracked Changes. Cable assemblies, cables, connectors and passive microwave component. Screening attenuation measurement by the reverberation chamber method

Published By Publication Date Number of Pages
BSI 2022 64
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This standard describes the measurement of screening attenuation by the reverberation chamber measurement method, also called mode stirred chamber method. This standard is applicable to screening attenuation measurements of cable assemblies, cables, connectors, and passive microwave components, such as waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners and etc. Modern electronic equipments have shown a demand for methods for testing screening attenuation performance of microwave components over their whole frequency range. Convenient measurement methods have existed for lower frequencies and components of regular shape. These measurement methods are described in IEC 62153 series standards. For much higher frequencies and for components of irregular shape, the reverberation chamber method should be used. Theoretically, the reverberation chamber method has no upper limit of the measurement frequency, but it is limited by the quality and sensitivity of the measurement system, and the lower limit of the measurement frequency is restricted by the size of the reverberation chamber.

PDF Catalog

PDF Pages PDF Title
1 30463609
39 A-30438754
40 undefined
43 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
44 Blank Page
45 English
CONTENTS
47 FOREWORD
49 1 Scope
2 Normative references
3 Terms and definitions
50 4 Principle of screening attenuation measurement
Figure 1 – System configuration example of screening attenuation by reverberation chamber
52 5 Measurement equipment
5.1 General test instruments
5.1.1 Frequency synthesizer
5.1.2 Spectrum analyser
5.1.3 Reverberation chamber
Figure 2 – System configuration example of screening attenuation by reverberation chamber with only one spectrum analyser
53 5.1.4 Mode stirrer
5.1.5 Input antenna
5.1.6 Reference antenna
5.1.7 Stepper motor
5.1.8 Linking devices
Table 1 – Recommended antennas
54 5.1.9 Other instruments
5.2 Return loss requirements for linking devices
5.3 Sampling system
5.3.1 General
5.3.2 Normal sampling system
55 5.3.3 Fast sampling system
6 DUT
6.1 DUT preparation
6.1.1 Cables
Table 2 – Number of sampling positions recommended for calibration and test
56 6.1.2 Connector
6.1.3 Cable assemblies
6.1.4 Passive microwave components
6.2 Installation of DUT
7 Measurement procedure
57 8 Caution notes
8.1 Speed of mode stirrer
8.2 Measurement of lossy DUT
8.3 Oscillation and resonance
58 8.4 Positioning of spectrum analyser
8.5 High power signal test
8.6 High dynamic range test
9 Acceptance criterion
10 Information to be given in the relevant specification
11 Test report
59 Annex A (informative)Example of a calibrator
A.1 Relationship between transfer impedance and screening attenuation
60 A.2 Example of a calibrator
Figure A.1 – Basic construction details
62 Bibliography

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BS EN IEC 61726:2022 - TC
$186.33