BS IEC 61163-2:1998:1999 Edition
$142.49
Reliability stress screening – Electronic components
Published By | Publication Date | Number of Pages |
BSI | 1999 | 32 |
Status | Withdrawn |
---|---|
Title | Reliability stress screening – Electronic components |
Publisher | BSI |
Committee | DS/1 |
Pages | 32 |
Publication Date | 1999-02-15 |
Withdrawn Date | 2020-05-06 |
Replaced By | BS EN IEC 61163-2:2020 |
ISBN | 0 580 30923 1 |
Standard Number | BS IEC 61163-2:1998 |
Identical National Standard Of | IEC 61163-2:1998 |
Descriptors | Data analysis, Vibration testing, Consumer-supplier relations, High-temperature testing, Vibration, Assessed reliability, Voltage, Quality assurance, Fatigue, Acceptance (approval), Thermal-shock tests, Error correction, Failure (quality control), Duration, Mechanical testing, Statistical distribution, Electronic equipment and components, Mathematical calculations, Electric current, Temperature, Management techniques, Distribution curves, Equations, Quality control, Thermal testing, Acceleration, Quality assurance systems, Flaw detection, Reliability, Stress, Visual inspection (testing) |
ICS Codes | 31.020 - Electronic components in general |