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BSI 21/30435579 DC:2021 Edition

BSI 21/30435579 DC:2021 Edition

$13.70

BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods – Part 10. Mechanical shock. Device and subassembly

Published By Publication Date Number of Pages
BSI 2021 14
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Status

Definitive
Pages

14
Publication Date

2021-05-14
Standard Number

21/30435579 DC
Title

BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods – Part 10. Mechanical shock. Device and subassembly
Identical National Standard Of

IEC 60749-10 Ed.2.0
Descriptors

Integrated circuits, Destructive testing, Electronic equipment and components, Mechanical shock, Environmental testing, Climate, Mechanical testing, Impact testing, Semiconductor devices, Semiconductor storage, Testing methods, Test methods
Publisher

BSI
Committee

EPL/47
ICS Codes 31.080.01 - Semiconductor devices in general

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BSI 21/30435579 DC
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