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BSI PD ISO/TR 16743:2013

$167.15

Optics and photonics. Wavefront sensors for characterising optical systems and optical components

Published By Publication Date Number of Pages
BSI 2013 36
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This Technical Report gives terms and definitions and describes techniques for the characterization of wavefronts influenced by optical systems and optical components. It describes basic configurations for a variety of wavefront sensing systems and discusses the usefulness of tests in different situations.

The aim is to cover practical instruments and techniques for measuring the wavefronts produced by optical systems and optical components. This Technical Report includes various implementations of the Hartmann method, the curvature sensor and applications of the knife-edge method. The use of interferometers is discussed. This Technical Report also includes techniques such as phase diversity and pyramid sensors, currently used in astronomy and being developed for other areas.

NOTE More information on interferometry can be found in ISO/TR 14999-1, ISO/TR 14999−2 and ISO/TR 14999−3.

This Technical Report explains briefly how these techniques work and includes diagrams illustrating the use of this type of equipment for making the measurements required for ISO 10110-5, ISO 10110-8, ISO 10110-12 (slope requirements) and ISO 10110-14.

PDF Catalog

PDF Pages PDF Title
6 Foreword
7 Section sec_1
Section sec_2
1 Scope
2 Introduction to wavefront sensing techniques
8 Section sec_3
Section sec_3.1
Table tab_a
Figure fig_1
3 Foucault knife-edge test
3.1 The knife-edge test
9 Section sec_3.2
Section sec_3.3
Section sec_3.4
3.2 Variations on the knife-edge test
3.3 Application of knife-edge test to diode lasers
3.4 The pyramid sensor
10 Table tab_b
Figure fig_2
Section sec_4
Section sec_4.1
Section sec_4.2
4 Screen testing
4.1 General
4.2 Hartmann test
11 Section sec_4.3
4.3 The development of automated wavefront sensing
12 Section sec_4.4
Table tab_c
Figure fig_3
Table tab_d
Figure fig_4
4.4 Shack-Hartmann test
13 Section sec_4.5
Section sec_4.5.1
Section sec_4.5.2
Section sec_4.5.3
4.5 Measurements with a Shack-Hartmann sensor
14 Section sec_4.5.4
Section sec_4.5.5
Section sec_4.5.5.1
Section sec_4.5.5.2
Section sec_5
Section sec_5.1
Figure fig_5
Section sec_5.2
5 Wavefront curvature sensors
5.1 General
5.2 Wavefront curvature sensing and phase diversity techniques
15 Table tab_e
Figure fig_6
Section sec_5.3
5.3 Phase diversity wavefront sensor with diffraction grating
16 Table tab_f
Figure fig_7
Section sec_6
Section sec_6.1
6 Wavefront sensing by interferometry
6.1 General
17 Section sec_6.2
6.2 Self-referencing interferometry
18 Section sec_6.3
Section sec_6.4
Section sec_6.4.1
6.3 Electronic detection and phase measurement
6.4 Shearing interferometry
19 Section sec_6.4.2
20 Section sec_6.4.3
21 Table tab_g
Figure fig_8
Section sec_6.4.4
Table tab_h
Figure fig_9
22 Section sec_6.4.5
Section sec_6.4.5.1
Section sec_6.4.5.2
23 Table tab_i
Figure fig_10
Section sec_6.5
Section sec_6.5.1
Section sec_6.5.2
6.5 Point-diffraction interferometers with error-free reference wavefronts
24 Table tab_j
Figure fig_11
Section sec_6.5.3
25 Table tab_k
Figure fig_12
26 Table tab_l
Figure fig_13
Section sec_6.6
6.6 Lateral shearing and the Ronchi test
27 Section sec_6.7
Table tab_m
Figure fig_14
6.7 Lateral shearing with a double frequency grating
28 Section sec_7
Table tab_1
7 Summary of wavefront sensing methods
29 Table tab_2
30 Table tab_3
31 Reference ref_1
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Bibliography
32 Reference ref_22
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BSI PD ISO/TR 16743:2013
$167.15