BSI PD ISO/TR 16743:2013
$167.15
Optics and photonics. Wavefront sensors for characterising optical systems and optical components
Published By | Publication Date | Number of Pages |
BSI | 2013 | 36 |
This Technical Report gives terms and definitions and describes techniques for the characterization of wavefronts influenced by optical systems and optical components. It describes basic configurations for a variety of wavefront sensing systems and discusses the usefulness of tests in different situations.
The aim is to cover practical instruments and techniques for measuring the wavefronts produced by optical systems and optical components. This Technical Report includes various implementations of the Hartmann method, the curvature sensor and applications of the knife-edge method. The use of interferometers is discussed. This Technical Report also includes techniques such as phase diversity and pyramid sensors, currently used in astronomy and being developed for other areas.
NOTE More information on interferometry can be found in ISO/TR 14999-1, ISO/TR 14999−2 and ISO/TR 14999−3.
This Technical Report explains briefly how these techniques work and includes diagrams illustrating the use of this type of equipment for making the measurements required for ISO 10110-5, ISO 10110-8, ISO 10110-12 (slope requirements) and ISO 10110-14.
PDF Catalog
PDF Pages | PDF Title |
---|---|
6 | Foreword |
7 | Section sec_1 Section sec_2 1 Scope 2 Introduction to wavefront sensing techniques |
8 | Section sec_3 Section sec_3.1 Table tab_a Figure fig_1 3 Foucault knife-edge test 3.1 The knife-edge test |
9 | Section sec_3.2 Section sec_3.3 Section sec_3.4 3.2 Variations on the knife-edge test 3.3 Application of knife-edge test to diode lasers 3.4 The pyramid sensor |
10 | Table tab_b Figure fig_2 Section sec_4 Section sec_4.1 Section sec_4.2 4 Screen testing 4.1 General 4.2 Hartmann test |
11 | Section sec_4.3 4.3 The development of automated wavefront sensing |
12 | Section sec_4.4 Table tab_c Figure fig_3 Table tab_d Figure fig_4 4.4 Shack-Hartmann test |
13 | Section sec_4.5 Section sec_4.5.1 Section sec_4.5.2 Section sec_4.5.3 4.5 Measurements with a Shack-Hartmann sensor |
14 | Section sec_4.5.4 Section sec_4.5.5 Section sec_4.5.5.1 Section sec_4.5.5.2 Section sec_5 Section sec_5.1 Figure fig_5 Section sec_5.2 5 Wavefront curvature sensors 5.1 General 5.2 Wavefront curvature sensing and phase diversity techniques |
15 | Table tab_e Figure fig_6 Section sec_5.3 5.3 Phase diversity wavefront sensor with diffraction grating |
16 | Table tab_f Figure fig_7 Section sec_6 Section sec_6.1 6 Wavefront sensing by interferometry 6.1 General |
17 | Section sec_6.2 6.2 Self-referencing interferometry |
18 | Section sec_6.3 Section sec_6.4 Section sec_6.4.1 6.3 Electronic detection and phase measurement 6.4 Shearing interferometry |
19 | Section sec_6.4.2 |
20 | Section sec_6.4.3 |
21 | Table tab_g Figure fig_8 Section sec_6.4.4 Table tab_h Figure fig_9 |
22 | Section sec_6.4.5 Section sec_6.4.5.1 Section sec_6.4.5.2 |
23 | Table tab_i Figure fig_10 Section sec_6.5 Section sec_6.5.1 Section sec_6.5.2 6.5 Point-diffraction interferometers with error-free reference wavefronts |
24 | Table tab_j Figure fig_11 Section sec_6.5.3 |
25 | Table tab_k Figure fig_12 |
26 | Table tab_l Figure fig_13 Section sec_6.6 6.6 Lateral shearing and the Ronchi test |
27 | Section sec_6.7 Table tab_m Figure fig_14 6.7 Lateral shearing with a double frequency grating |
28 | Section sec_7 Table tab_1 7 Summary of wavefront sensing methods |
29 | Table tab_2 |
30 | Table tab_3 |
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