IEEE IEC 62860 1 2013
$62.29
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
| Published By | Publication Date | Number of Pages |
| IEEE | 2013 | 26 |
Adoption Standard – Active. Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1620.1-2006 (IEC 62860-1:2013) Front Cover |
| 4 | CONTENTS |
| 5 | Foreword |
| 7 | Title page |
| 9 | IEEE Introduction Notice to users Errata |
| 10 | Patents |
| 11 | 1. Overview 1.1 Scope 1.2 Purpose 1.3 Electrical characterization overview |
| 14 | 2. Definitions, abbreviations and acronyms 2.1 Definitions 2.2 Acronyms |
| 15 | 3. Standard ring oscillator characterization procedures 3.1 Circuit layout 3.2 Guidelines for the ring oscillator characterization process |
| 16 | 3.3 Other applicable standards 3.4 Reporting data |
| 20 | 3.5 Environmental control and standards |
| 21 | Annex A (informative) Bibliography |
| 22 | Annex B (informative) IEEE List of Participants |
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