{"id":233519,"date":"2024-10-19T15:13:18","date_gmt":"2024-10-19T15:13:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-ts-62132-92014\/"},"modified":"2024-10-25T09:43:32","modified_gmt":"2024-10-25T09:43:32","slug":"bsi-pd-iec-ts-62132-92014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-ts-62132-92014\/","title":{"rendered":"BSI PD IEC\/TS 62132-9:2014"},"content":{"rendered":"

This part of IEC 62132<\/span> <\/span> provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. This test procedure is applicable to testing an IC mounted on any circuit board that is accessible to the scanning probe. In some cases it is useful to scan not only the IC but also its environment. For comparison of surface scan immunity between different ICs, the standardized test board defined in IEC 62132\u20111<\/span> <\/span> should be used.<\/p>\n

This measurement method provides a mapping of the sensitivity (immunity) to electric- or magnetic-near-field disturbance over the IC. The resolution of the test is determined by the capability of the test probe and the precision of the Probe-positioning system. This method is intended for use up to 6 GHz. Extending the upper limit of frequency is possible with existing probe technology but is beyond the scope of this specification. The tests described in this document are carried out in the frequency domain using continuous wave (CW), amplitude modulated (AM) or pulse modulated (PM) signals.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
4<\/td>\nEnglish
\n
CONTENTS <\/td>\n<\/tr>\n
6<\/td>\nFOREWORD <\/td>\n<\/tr>\n
8<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms, definitions and abbreviations
3.1 Terms and definitions <\/td>\n<\/tr>\n
10<\/td>\n3.2 Abbreviations
4 General <\/td>\n<\/tr>\n
11<\/td>\n5 Test Conditions
5.1 General
5.2 Supply voltage
5.3 Frequency range
6 Test equipment
6.1 General
6.2 Shielding
6.3 RF disturbance generator
6.4 Cables <\/td>\n<\/tr>\n
12<\/td>\n6.5 Near-field probe
6.5.1 General
6.5.2 Magnetic (H) field probe
6.5.3 Electric (E) field probe
6.6 Probe-positioning and data acquisition system <\/td>\n<\/tr>\n
13<\/td>\n6.7 DUT monitor
7 Test setup
7.1 General
7.2 Test configuration
Figures
\n
Figure 1 \u2013 Example of a probe-positioning system <\/td>\n<\/tr>\n
14<\/td>\n7.3 Test circuit board
7.4 Probe-positioning system software setup
7.5 DUT Software
8 Test procedure
8.1 General
Figure 2 \u2013 Test setup <\/td>\n<\/tr>\n
15<\/td>\n8.2 Operational check
8.3 Immunity test
8.3.1 General
8.3.2 Amplitude modulation
8.3.3 Test frequency steps and ranges
8.3.4 Test levels and dwell time
Tables
\n
Table 1 \u2013 Frequency step size versus frequency range <\/td>\n<\/tr>\n
16<\/td>\n8.3.5 DUT monitoring
8.3.6 Detailed procedure <\/td>\n<\/tr>\n
17<\/td>\n9 Test report
9.1 General
9.2 Test conditions
9.3 Probe design and calibration
9.4 Test data <\/td>\n<\/tr>\n
18<\/td>\n9.5 Post-processing
9.6 Data exchange
Figure 3 \u2013 Example of data overlaid on an image of the DUT <\/td>\n<\/tr>\n
19<\/td>\nAnnex\u00a0A (informative)Calibration of near-field probes
A.1 General <\/td>\n<\/tr>\n
20<\/td>\nTable A.1 \u2013 Probe factor linear units
Table A.2 \u2013 Probe factor logarithmic units <\/td>\n<\/tr>\n
21<\/td>\nFigure A.1 \u2013 Typical probe factor in dB (\uf057.m2) against frequency
Figure A.2 \u2013 Typical probe factor in dB (S\/m2) against frequency <\/td>\n<\/tr>\n
22<\/td>\nA.2 Test equipment
A.3 Calibration setup
A.4 Calibration procedure
Figure A.3 \u2013 Probe calibration setup <\/td>\n<\/tr>\n
24<\/td>\nAnnex\u00a0B (informative) Electric and magnetic field probes
B.1 General
B.2 Probe electrical description
B.3 Probe physical description
B.3.1 Probe construction
Figure B.1 \u2013 Basic structure of electric and magnetic field probe schematics <\/td>\n<\/tr>\n
25<\/td>\nB.3.2 Electric field probe
B.3.3 Magnetic field probe
Figure B.2 \u2013 Example of electric field probe construction (EZ)
Figure B.3 \u2013 Example of magnetic field probe construction (HX or HY) <\/td>\n<\/tr>\n
26<\/td>\nAnnex\u00a0C (informative)Coordinate systems
C.1 General
C.2 Cartesian coordinate system
Figure C.1 \u2013 Right-hand Cartesian coordinate system (preferred) <\/td>\n<\/tr>\n
27<\/td>\nC.3 Cylindrical coordinate system
Figure C.2 \u2013 Left-hand Cartesian coordinate system
Figure C.3 \u2013 Cylindrical coordinate system <\/td>\n<\/tr>\n
28<\/td>\nC.4 Spherical coordinate system
C.5 Coordinate system conversion
Figure C.4 \u2013 Spherical coordinate system
Table C.1 \u2013 Coordinate system conversion <\/td>\n<\/tr>\n
29<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Integrated circuits. Measurement of electromagnetic immunity – Measurement of radiated immunity. Surface scan method<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2014<\/td>\n32<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":233520,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-233519","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/233519","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/233520"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=233519"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=233519"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=233519"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}