{"id":233854,"date":"2024-10-19T15:15:03","date_gmt":"2024-10-19T15:15:03","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62047-292017\/"},"modified":"2024-10-25T09:46:01","modified_gmt":"2024-10-25T09:46:01","slug":"bs-iec-62047-292017","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62047-292017\/","title":{"rendered":"BS IEC 62047-29:2017"},"content":{"rendered":"

IEC 62047-29:2017(E) specifies a relaxation test method for measuring electromechanical properties of freestanding conductive thin films for micro-electromechanical systems (MEMS) under controlled strain and room temperature. Freestanding thin films of conductive materials are extensively utilized in MEMS, opto-electronics, and flexible\/wearable electronics products. Freestanding thin films in the products experience external and internal stresses which could be relaxed even under room temperature during a period of operation, and this relaxation leads to time-dependent variation of electrical performances of the products. This test method is valid for isotropic, homogeneous, and linearly viscoelastic materials.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
5<\/td>\nFOREWORD <\/td>\n<\/tr>\n
7<\/td>\n1 Scope
2 Normative references
3 Terms and symbols
3.1 Terms and definitions <\/td>\n<\/tr>\n
8<\/td>\n3.2 Symbols and designations
Figures
Figure 1 \u2013 Freestanding test piece
Table 1 \u2013 Symbols and designations of a test piece <\/td>\n<\/tr>\n
9<\/td>\n4 Test piece
4.1 General
4.2 Shape of a test piece
4.3 Measurement of dimensions
5 Test principle and test apparatus
5.1 Test principle
5.2 Test environment
5.3 Test machine <\/td>\n<\/tr>\n
10<\/td>\n5.4 Test procedure
5.5 Data analysis
Figure 2 \u2013 Experimental setup <\/td>\n<\/tr>\n
11<\/td>\n6 Test report <\/td>\n<\/tr>\n
12<\/td>\nAnnex A (informative) Electromechanical relaxation test example of freestanding Au film
A.1 Testing overview
Figure A.1 \u2013 Photograph of test equipment and a schematicfor experimental setup <\/td>\n<\/tr>\n
13<\/td>\nA.2 Testing results <\/td>\n<\/tr>\n
14<\/td>\nFigure A.2 \u2013 Electromechanical relaxation data of freestanding Au film with a thickness of 1 \u03bcm <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices. Micro-electromechanical devices – Electromechanical relaxation test method for freestanding conductive thin-films under room temperature<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2018<\/td>\n16<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":233856,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2641],"product_tag":[],"class_list":{"0":"post-233854","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/233854","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/233856"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=233854"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=233854"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=233854"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}