IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 18<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 General <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 5 Equipment 5.1 Equipment summary 5.2 Temperature and relative humidity 5.3 Devices under stress 5.4 Minimizing release of contamination 5.5 Ionic contamination 5.6 Deionized water 6 Test conditions 6.1 Test conditions summary 6.2 Temperature, relative humidity and duration Table 1 \u2013 Temperature, relative humidity and duration <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 6.3 Biasing guidelines 6.4 Biasing choice and reporting <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 7 Procedures 7.1 Mounting 7.2 Ramp-up 7.3 Ramp-down 7.4 Test clock 7.5 Bias 7.6 Read-out Table 2 \u2013 Criteria for choosing continuous or cyclical bias <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 7.7 Handling 8 Failure criteria 9 Safety 10 Summary <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life test<\/b><\/p>\n |