{"id":242217,"date":"2024-10-19T15:52:25","date_gmt":"2024-10-19T15:52:25","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-61000-4-102017\/"},"modified":"2024-10-25T10:44:09","modified_gmt":"2024-10-25T10:44:09","slug":"bs-en-61000-4-102017","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-61000-4-102017\/","title":{"rendered":"BS EN 61000-4-10:2017"},"content":{"rendered":"<p>This part of <span class=\"std\"> <span class=\"std-ref\">IEC&nbsp;61000<\/span> <\/span> specifies the immunity requirements, test methods, and range of recommended test levels for equipment subjected to damped oscillatory magnetic disturbances related to medium voltage and high voltage sub-stations.<\/p>\n<p>The test defined in this standard is applied to equipment which is intended to be installed in locations where the phenomenon as specified in <span class=\"xref\">Clause&nbsp;4<\/span> will be encountered.<\/p>\n<p>This standard does not specify disturbances due to capacitive or inductive coupling in cables or other parts of the field installation. <span class=\"std\"> <span class=\"std-ref\">IEC&nbsp;61000\u20114\u201118<\/span> <\/span>, which deals with conducted disturbances, covers these aspects.<\/p>\n<p>The object of this standard is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment for medium voltage and high voltage substations when subjected to damped oscillatory magnetic fields.<\/p>\n<p>The test is mainly applicable to electronic equipment to be installed in H.V. sub-stations. Power plants, switchgear installations, smart grid systems may also be applicable to this standard and may be considered by product committees.<\/p>\n<div class=\"non-normative-note\">\n<div class=\"note-label\">\n  NOTE\n <\/div>\n<p>As described in <span class=\"std\"> <span class=\"std-ref\">IEC&nbsp;Guide&nbsp;107<\/span> <\/span>, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide&nbsp;107, the IEC product committees are responsible for determining whether this immunity test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity test levels for their products.<\/p>\n<\/div>\n<p>This standard defines:<\/p>\n<ul>\n<li>\n<p>a range of test levels;<\/p>\n<\/li>\n<li>\n<p>test equipment;<\/p>\n<\/li>\n<li>\n<p>test setups;<\/p>\n<\/li>\n<li>\n<p>test procedures.<\/p>\n<\/li>\n<\/ul>\n<h4>PDF Catalog<\/h4>\n<table border=\"1px\" class=\"des-table\">\n<tr>\n<th>PDF Pages<\/th>\n<th>PDF Title<\/th>\n<\/tr>\n<tr>\n<td><b>6<b><\/td>\n<td>English <br \/> CONTENTS  <\/td>\n<\/tr>\n<tr>\n<td><b>9<b><\/td>\n<td>FOREWORD  <\/td>\n<\/tr>\n<tr>\n<td><b>11<b><\/td>\n<td>INTRODUCTION  <\/td>\n<\/tr>\n<tr>\n<td><b>12<b><\/td>\n<td>1 Scope and object <br \/> 2 Normative references  <\/td>\n<\/tr>\n<tr>\n<td><b>13<b><\/td>\n<td>3 Terms, definitions and abbreviated terms <br \/> 3.1 Terms and definitions  <\/td>\n<\/tr>\n<tr>\n<td><b>14<b><\/td>\n<td>3.2 Abbreviations <br \/> 4 General <br \/> 5 Test levels  <\/td>\n<\/tr>\n<tr>\n<td><b>15<b><\/td>\n<td>6 Test instrumentation <br \/> 6.1 General <br \/> 6.2 Damped oscillatory wave generator <br \/> 6.2.1 General <br \/> Tables <br \/> Table 1 \u2013 Test levels  <\/td>\n<\/tr>\n<tr>\n<td><b>16<b><\/td>\n<td>6.2.2 Performance characteristics of the generator connected to the standard induction coil <br \/> Figures <br \/> Figure 1 \u2013 Simplified schematic circuit of the test generatorfor damped oscillatory magnetic field  <\/td>\n<\/tr>\n<tr>\n<td><b>17<b><\/td>\n<td>Figure 2 \u2013 Waveform of short-circuit current in the standard coils <br \/> Figure 3 \u2013 Waveform of short-circuit current showing the repetition time Trep  <\/td>\n<\/tr>\n<tr>\n<td><b>18<b><\/td>\n<td>6.3 Standard induction coil <br \/> 6.4 Calibration of the test system <br \/> Figure 4 \u2013 Example of a current measurement of standard induction coils  <\/td>\n<\/tr>\n<tr>\n<td><b>19<b><\/td>\n<td>7 Test setup <br \/> 7.1 Test equipment <br \/> 7.2 Verification of the test instrumentation <br \/> Table 2 \u2013 Peak current specifications of the test system <br \/> Table 3 \u2013 Waveform specifications of the test system  <\/td>\n<\/tr>\n<tr>\n<td><b>20<b><\/td>\n<td>7.3 Test setup for table-top EUT <br \/> 7.4 Test setup for floor standing EUT <br \/> Figure 5 \u2013 Example of test setup for table-top equipment  <\/td>\n<\/tr>\n<tr>\n<td><b>21<b><\/td>\n<td>Figure 6 \u2013 Example of test setup for floor standing equipmentshowing the horizontal orthogonal plane <br \/> Figure 7 \u2013 Example of test setup for floor standing equipmentshowing the vertical orthogonal plane  <\/td>\n<\/tr>\n<tr>\n<td><b>22<b><\/td>\n<td>7.5 Test setup for damped oscillatory field applied in-situ <br \/> 8 Test procedure <br \/> 8.1 General <br \/> 8.2 Laboratory reference conditions <br \/> 8.2.1 Climatic conditions <br \/> 8.2.2 Electromagnetic conditions <br \/> Figure 8 \u2013 Example of test setup using the proximity method  <\/td>\n<\/tr>\n<tr>\n<td><b>23<b><\/td>\n<td>8.3 Execution of the test <br \/> 9 Evaluation of test results  <\/td>\n<\/tr>\n<tr>\n<td><b>24<b><\/td>\n<td>10 Test report  <\/td>\n<\/tr>\n<tr>\n<td><b>25<b><\/td>\n<td>Annex A  (informative)  Information on the field distribution of standard induction coils <br \/> A.1 General <br \/> A.2 Determination of the coil factor <br \/> A.2.1 General <br \/> A.2.2 Coil factor calculation  <\/td>\n<\/tr>\n<tr>\n<td><b>26<b><\/td>\n<td>A.3 1 m x 1 m standard induction coil <br \/> Figure A.1 \u2013 Rectangular induction coil with sides a + b and c <br \/> Figure A.2 \u2013 +3 dB isoline for the magnetic field strength (magnitude)in the x-y plane for the 1 m x 1 m induction coil  <\/td>\n<\/tr>\n<tr>\n<td><b>27<b><\/td>\n<td>A.4 1 m x 2,6 m standard induction coil with reference ground plane <br \/> Figure A.3 \u2013 +3 dB and \u20133 dB isolines for the magnetic field strength (magnitude)in the x-z plane for the 1 m x 1 m induction coil <br \/> Figure A.4 \u2013 +3 dB isoline for the magnetic field strength (magnitude) in the x-z planefor the 1 m x 2,6 m induction coil with reference ground plane  <\/td>\n<\/tr>\n<tr>\n<td><b>28<b><\/td>\n<td>A.5 1 m x 2,6 m standard induction coil without reference ground plane <br \/> Figure A.5 \u2013 +3 dB and \u20133 dB isolines for the magnetic field strength (magnitude)in the x-y plane for the 1 m x 2,6 m induction coil with reference ground plane <br \/> Figure A.6 \u2013 +3 dB isoline for the magnetic field strength (magnitude) in the x-y planefor the 1 m x 2,6 m induction coil without reference ground plane  <\/td>\n<\/tr>\n<tr>\n<td><b>29<b><\/td>\n<td>Figure A.7 \u2013 +3 dB and \u20133 dB isolines for the magnetic field strength (magnitude)in the x-z plane for the 1 m x 2,6 m induction coil without reference ground plane  <\/td>\n<\/tr>\n<tr>\n<td><b>30<b><\/td>\n<td>Annex B  (informative)  Selection of the test levels  <\/td>\n<\/tr>\n<tr>\n<td><b>32<b><\/td>\n<td>Annex C  (informative)  Damped oscillatory magnetic field frequency  <\/td>\n<\/tr>\n<tr>\n<td><b>33<b><\/td>\n<td>Annex D  (informative)  Measurement uncertainty (MU) considerations <br \/> D.1 General <br \/> D.2 Legend <br \/> D.3 Uncertainty contributors to the peak current and to the damped oscillatory magnetic field measurement uncertainty  <\/td>\n<\/tr>\n<tr>\n<td><b>34<b><\/td>\n<td>D.4 Uncertainty of peak current and damped oscillatory magnetic field calibration <br \/> D.4.1 General <br \/> D.4.2 Peak current  <\/td>\n<\/tr>\n<tr>\n<td><b>35<b><\/td>\n<td>Table D.1 \u2013 Example of uncertainty budget for the peak ofthe damped oscillatory current impulse (Ip)  <\/td>\n<\/tr>\n<tr>\n<td><b>36<b><\/td>\n<td>D.4.3 Further MU contributions to amplitude and time measurements <br \/> D.4.4 Rise time of the step response and bandwidth of the frequency response of the measuring system  <\/td>\n<\/tr>\n<tr>\n<td><b>37<b><\/td>\n<td>D.4.5 Impulse peak distortion due to the limited bandwidth of the measuring system <br \/> Table D.2 \u2013  factor (see equation (D.6)) of different unidirectional impulse responses corresponding to the same bandwidth of the system B  <\/td>\n<\/tr>\n<tr>\n<td><b>38<b><\/td>\n<td>D.5 Application of uncertainties in the damped oscillatory wave generator compliance criterion <br \/> Table D.3 \u2013 \u03b2 factor (equation (D.12)) of the damped oscillatory waveform  <\/td>\n<\/tr>\n<tr>\n<td><b>39<b><\/td>\n<td>Annex E  (informative)  3D numerical simulations <br \/> E.1 General <br \/> E.2 Simulations <br \/> E.3 Comments  <\/td>\n<\/tr>\n<tr>\n<td><b>40<b><\/td>\n<td>Figure E.1 \u2013 Current with period of 1 \u00b5s and H-field in the centerof the 1 m x 1 m standard induction coil <br \/> Figure E.2 \u2013 Hx\u2013field along the side of 1 m x 1 m standard induction coil in A\/m  <\/td>\n<\/tr>\n<tr>\n<td><b>41<b><\/td>\n<td>Figure E.3 \u2013 Hx\u2013field in direction x perpendicular to the planeof the 1 m x 1 m standard induction coil <br \/> Figure E.4 \u2013 Hx\u2013field along the side in dB for 1 m x 1 m standard induction coil  <\/td>\n<\/tr>\n<tr>\n<td><b>42<b><\/td>\n<td>Figure E.5 \u2013 Hx\u2013field along the diagonal in dB for the 1 m x 1 m standard induction coil <br \/> Figure E.6 \u2013 Hx\u2013field plot on y-z plane for the 1 m x 1 m standard induction coil  <\/td>\n<\/tr>\n<tr>\n<td><b>43<b><\/td>\n<td>Figure E.7 \u2013 Hx-field plot on x-y plane for the 1 m x 1 m standard induction coil <br \/> Figure E.8 \u2013 Hx\u2013field along the vertical middle line in dB forthe 1 m x 2,6 m standard induction coil  <\/td>\n<\/tr>\n<tr>\n<td><b>44<b><\/td>\n<td>Figure E.9 \u2013 Hx\u2013field 2D\u2013plot on y-z plane for the 1 m x 2,6 m standard induction coil <br \/> Figure E.10 \u2013 Hx\u2013field 2D\u2013plot on x-y plane at z = 0,5 m forthe 1 m x 2,6 m standard induction coil  <\/td>\n<\/tr>\n<tr>\n<td><b>45<b><\/td>\n<td>Bibliography  <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p><b>Electromagnetic compatibility (EMC) &#8211; Testing and measurement techniques. Damped oscillatory magnetic field immunity test<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/bsi\/\"><b>BSI<\/b><\/a><\/td>\n<td>2017<\/td>\n<td>48<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":242219,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[626,2641],"product_tag":[],"class_list":{"0":"post-242217","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-33-100-20","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/242217","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/242219"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=242217"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=242217"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=242217"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}