{"id":424528,"date":"2024-10-20T06:52:12","date_gmt":"2024-10-20T06:52:12","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-146062022-tc\/"},"modified":"2024-10-26T12:55:07","modified_gmt":"2024-10-26T12:55:07","slug":"bs-iso-146062022-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-146062022-tc\/","title":{"rendered":"BS ISO 14606:2022 – TC"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\n30469774 <\/td>\n<\/tr>\n
35<\/td>\nA-30440165 <\/td>\n<\/tr>\n
36<\/td>\nNational foreword <\/td>\n<\/tr>\n
40<\/td>\nForeword <\/td>\n<\/tr>\n
41<\/td>\nIntroduction <\/td>\n<\/tr>\n
43<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms <\/td>\n<\/tr>\n
44<\/td>\n5 Setting parameters for sputter depth profiling
5.1 General
5.2 Auger electron spectroscopy <\/td>\n<\/tr>\n
45<\/td>\n5.3 X-ray photoelectron spectroscopy
5.4 Secondary ion mass spectrometry <\/td>\n<\/tr>\n
46<\/td>\n6 Depth resolution at an ideally sharp interface in sputter depth profiles
6.1 Measurement of depth resolution
6.2 Average sputtering rate \ufffc
6.3 Depth resolution \u2206z <\/td>\n<\/tr>\n
47<\/td>\n7 Procedures for optimization of parameter settings
7.1 Alignment of sputtered area with a smaller analysis area
7.1.1 General <\/td>\n<\/tr>\n
48<\/td>\n7.1.2 AES <\/td>\n<\/tr>\n
49<\/td>\n7.1.3 XPS with a small probe (e.g. monochromator)
7.1.4 XPS with a large area source (e.g. without monochromator)
7.1.5 SIMS
7.2 Optimization of parameter settings <\/td>\n<\/tr>\n
51<\/td>\nAnnex A (informative) Factors influencing the depth resolution <\/td>\n<\/tr>\n
54<\/td>\nAnnex B (informative) Typical single-layered systems as reference materials <\/td>\n<\/tr>\n
55<\/td>\nAnnex C (informative) Typical multilayered systems used as reference materials <\/td>\n<\/tr>\n
56<\/td>\nAnnex D (informative) Uses of multilayered systems <\/td>\n<\/tr>\n
57<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2023<\/td>\n60<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":424536,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1000,2641],"product_tag":[],"class_list":{"0":"post-424528","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-40","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/424528","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/424536"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=424528"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=424528"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=424528"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}