{"id":425195,"date":"2024-10-20T06:55:32","date_gmt":"2024-10-20T06:55:32","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-232162021-2\/"},"modified":"2024-10-26T13:02:58","modified_gmt":"2024-10-26T13:02:58","slug":"bs-iso-232162021-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-232162021-2\/","title":{"rendered":"BS ISO 23216:2021"},"content":{"rendered":"
This document specifies spectroscopic ellipsometry for the determination of optical properties (refractive index n<\/i> and extinction coefficient k<\/i>) and the optical classification of different types of amorphous carbon films within the n<\/i>–k<\/i> plane.<\/p>\n
It is applicable to amorphous carbon films deposited by ionized evaporation, sputtering, arc deposition, plasma-assisted chemical vapour deposition, hot filament techniques and others.<\/p>\n
It does not apply to carbon films modified with metals or silicon, amorphous carbon films that have a gradient of composition\/property in the thickness, paints and varnishes.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Test specimen preparation <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5 Apparatus 6 Procedure 6.1 Treatment of specimen before test 6.2 Preparation for test 6.3 Testing conditions for test <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 6.4 Optical model for analysis 6.5 Number of test repeats 7 Classification of test results 8 Test report <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Annex A (normative) Classification method for amorphous carbon films by optical properties <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Carbon based films. Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry<\/b><\/p>\n |