{"id":453644,"date":"2024-10-20T09:31:23","date_gmt":"2024-10-20T09:31:23","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-241732024-2\/"},"modified":"2024-10-26T17:39:53","modified_gmt":"2024-10-26T17:39:53","slug":"bs-iso-241732024-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-241732024-2\/","title":{"rendered":"BS ISO 24173:2024"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
14<\/td>\n4 Equipment for EBSD <\/td>\n<\/tr>\n
15<\/td>\n5 Operating conditions
5.1 Specimen preparation
5.2 Specimen alignment
5.3 Common steps in collecting an EBSP
5.3.1 Setting the microscope operating conditions <\/td>\n<\/tr>\n
16<\/td>\n5.3.2 Detector and working distances
5.3.3 Camera integration\/exposure time
5.3.4 Binning <\/td>\n<\/tr>\n
17<\/td>\n5.3.5 EBSP averaging
5.3.6 EBSP background correction\/EBSP signal correction <\/td>\n<\/tr>\n
18<\/td>\n5.3.7 Band detection <\/td>\n<\/tr>\n
19<\/td>\n6 Calibrations required for indexing of EBSPs <\/td>\n<\/tr>\n
22<\/td>\n7 Analytical procedure
7.1 Operating conditions <\/td>\n<\/tr>\n
23<\/td>\n7.2 Equipment stability check
7.3 EBSD analysis
8 Measurement uncertainty
8.1 General
8.2 Uncertainty of crystal orientation measurement
8.3 Absolute orientation
8.4 Relative orientation <\/td>\n<\/tr>\n
24<\/td>\n9 Reporting the results <\/td>\n<\/tr>\n
25<\/td>\nAnnex A (informative) Principle of EBSD <\/td>\n<\/tr>\n
26<\/td>\nAnnex B (informative) Specimen preparation for EBSD <\/td>\n<\/tr>\n
32<\/td>\nAnnex C (informative) Brief introduction to crystallography and EBSP indexing, and other information useful for EBSD <\/td>\n<\/tr>\n
47<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2024<\/td>\n50<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":453654,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1001,2641],"product_tag":[],"class_list":{"0":"post-453644","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-50","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/453644","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/453654"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=453644"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=453644"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=453644"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}