{"id":81011,"date":"2024-10-17T18:50:22","date_gmt":"2024-10-17T18:50:22","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1302-2009\/"},"modified":"2024-10-24T19:45:25","modified_gmt":"2024-10-24T19:45:25","slug":"ieee-1302-2009","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1302-2009\/","title":{"rendered":"IEEE 1302 2009"},"content":{"rendered":"
Revision Standard – Active. The scope of the proposed project is to provide manufacturers of gaskets and designers of electronic systems appropriate methods for the characterization of gaskets. It will guide the user in the selection of the appropriate test method in order to determine the level of shielding provided in the intended application.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std 1302-2008 Front cover <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Introduction Notice to users Laws and regulations Copyrights Updating of IEEE documents <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Errata Interpretations Patents Participants <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Important notice 1. Overview 1.1 Background <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1.2 Scope 1.3 Purpose <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 2. Normative references 3. Acronyms and abbreviations clause <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4. Factors affecting gasket performance <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5. Gasket measurement techniques <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 6. Standardized gasket measuring techniques 6.1 Transfer impedance\u2014SAE ARP 1705-2006 (Rev. A) <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 6.2 Relative aperture transmission <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 7. Alternative techniques, derived from standardized methods 7.1 General 7.2 Effective transmission aperture <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 7.3 Slot aperture <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 7.4 (Nested) reverberation chambers <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 8. Alternative, non-standardized methods 8.1 General 8.2 Far-field TEM-t fixture <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 8.3 Near-field H-t fixture <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 8.4 DC resistance measurement 9. Selecting a gasket measurement technique 9.1 General 9.2 Measurement reference <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 9.3 Sample configuration 9.4 Frequency range <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 9.5 Dynamic range <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 9.6 Other considerations 10. Repeatability and measurement uncertainty 10.1 Repeatability <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 10.2 Measurement uncertainty <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 11. Test plan 11.1 General 11.2 Test plan parameters to be defined 11.3 Calibration 11.4 Reference level and dynamic range <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 12. Technical report 12.1 General 12.2 Status letter 12.3 Full test report <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | Annex A (normative) Summary of measuring techniques for gasket <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | Annex B (normative) Introduction to the electromagnetic behavior of gasketed joints <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | Annex C (informative) Detailed tabulation of standardized aperture transmission methods <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | Annex D (informative) Some in-depth discussion on the use of reverberation chambers <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | Annex E (informative) Test methods for on-board gasket applications <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | Annex F (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Guide for the Electromagnetic Characterization of Conductive Gaskets in the Frequency Range of DC to 18 GHz<\/b><\/p>\n |