{"id":81443,"date":"2024-10-17T18:54:47","date_gmt":"2024-10-17T18:54:47","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1671-2006\/"},"modified":"2024-10-24T19:46:45","modified_gmt":"2024-10-24T19:46:45","slug":"ieee-1671-2006","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1671-2006\/","title":{"rendered":"IEEE 1671 2006"},"content":{"rendered":"

New IEEE Standard – Inactive – Superseded. This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1671-2006 Front Cover <\/td>\n<\/tr>\n
3<\/td>\nTitle Page <\/td>\n<\/tr>\n
6<\/td>\nIntroduction
Notice to users
Laws and regulations
Copyrights <\/td>\n<\/tr>\n
7<\/td>\nUpdating of IEEE documents
Errata
Interpretations
Patents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
10<\/td>\nContents <\/td>\n<\/tr>\n
11<\/td>\nImportant Notice
1. Overview
1.1 Scope
1.2 Purpose <\/td>\n<\/tr>\n
12<\/td>\n1.3 Application
1.4 Conventions used within this document <\/td>\n<\/tr>\n
13<\/td>\n2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
15<\/td>\n3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n
16<\/td>\n4. Automatic Test Markup Language
4.1 Background
4.2 Purpose
4.3 ATML and the product life cycle <\/td>\n<\/tr>\n
19<\/td>\n4.4 ATML framework <\/td>\n<\/tr>\n
21<\/td>\n4.5 Specification techniques <\/td>\n<\/tr>\n
23<\/td>\n4.6 ATML component standards <\/td>\n<\/tr>\n
25<\/td>\n4.7 XML schema names and locations <\/td>\n<\/tr>\n
26<\/td>\n5. Conformance
6. Extensibility <\/td>\n<\/tr>\n
27<\/td>\nAnnex A (normative) XML schema style guidelines <\/td>\n<\/tr>\n
35<\/td>\nAnnex B (normative) ATML common element schemas <\/td>\n<\/tr>\n
88<\/td>\nAnnex C (informative) Architecture examples <\/td>\n<\/tr>\n
94<\/td>\nAnnex D (informative) Glossary <\/td>\n<\/tr>\n
97<\/td>\nAnnex E (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2006<\/td>\n99<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":81444,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-81443","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/81443","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/81444"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=81443"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=81443"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=81443"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}