{"id":82347,"date":"2024-10-18T03:04:17","date_gmt":"2024-10-18T03:04:17","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-389-1990\/"},"modified":"2024-10-24T19:49:53","modified_gmt":"2024-10-24T19:49:53","slug":"ieee-389-1990","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-389-1990\/","title":{"rendered":"IEEE 389 1990"},"content":{"rendered":"
Revision Standard – Inactive – Superseded. A number of tests are presented for use in determining the significant parameters and performance characteristics of electronics transformers and inductors. These tests are designed primarily for transformers and inductors used in all types of electronics applications, but they may apply to the other types of transformers of large apparent-power rating used in the electric power utility industry. Some of the tests are intended for qualifying a product for a specific application, while others are test practices used widely for manufacturing and customer acceptance testing. A guide for particular application categories is included.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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5<\/td>\n | Measurement <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 1 Scope Recommended Practice Is Applicable 1.2 References <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 2 Definitions How to Specify Electronic Transformers Insulation and Corona Tests 4.1 General 4.2 Electric Strength Test (Also Known as Hi-Pot Test) <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Typical High-Potential Test Showing Sec 1 Under Test Typical High-Potential Test of Inductor <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Groups <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Induced Potential Test Fig 3 Block Diagram of Induced Voltage Surge Test <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 4.4 Corona Tests Resistance Tests 5.1 General <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Typical Circuit for Corona Measurement Circuit Typical Circuit for Corona Measurement Circuit <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5.2 Resistance Values Under 1 Ohm Measurement of Low Resistance Kelvin Double-Bridge Method of Measuring Low Resistance <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Resistance Values from 1 Ohm to Many Kilohms Ammeter and Voltmeter Method of Resistance Measurement <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Measurement of Resistance by Substitution <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Resistance Values from Under 1 Ohm to Many Kilohms Principle of Series Ohmmeter Digital Ohmmeter Method of Resistance Measurements <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Loss Measurements 6.1 No-Load Loss <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Triangular Flux-Density Variation in Transformer Core Suggested Values for Specifying No-Load Tests <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Test Circuit for Transformer No-Load Losses <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Excitation Apparent-Power Measurements 6.3 Stray-Load Losses <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Short-circuit Power Test Simplified Diagram for Short-circuit Power Test <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Efficiency and Power Factor Ratio of Transformation 7.1 General <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 7.2 Measurement Methods <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 7.3 Impedance Unbalance Resistive Ratio Bridge Bridge with Ratio Transformer Ratio of Transformation from Voltage Measurements <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 7.4 Balance Tests Bridge Circuit for Measurement of Impedance Unbalance <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Test Circuits for Balance Tests <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 7.5 Polarity Tests 8 Transformer Capacitance 8.1 General 8.2 Interwinding Capacitance Polarity Test Using Voltage Measurements <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | Measuring Techniques for Transformer Capacitance Simplified Circuit for Transformer Capacitance Measurement Test Circuit for Interwinding Capacitance Measurement <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 8.3 Distributed Capacitance 8.4 Bridge Methods 9 Inductance Measurements by Impedance Bridge Method 9.1 General Test Circuit for Distributed Capacitance Measurement Circuit for Bridge Method <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | Method of Measurement <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Typical Bridge Circuits for Inductance Measurements <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 10 Transformer Response Measurements Transformer Frequency Response Test Circuit for Frequency Response Measurements <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | Test Circuit for Frequency Response Measurements with DC CurrenW <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | Transformer Pulse Response Alternate Method for Frequency Response Measurements Measurement of Transformer Loss <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | Test Circuit for Low-Level Pulse Response <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | Noise Tests Test Conditions for Audible Noise Measurement of Audible Noise 11.3 EM1 Noise Terminated Impedance Measurements 12.1 General Sound-Level Corrections for Noise Tests <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | 12.2 Return-Loss Method Return-Loss Bridges <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | Return-Loss Measurement <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | Temperature Rise Tests 13.1 Test Methods Determination of Resistance at Zero Time <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | 14 Self-Resonance 14.1 General 14.2 Measurement Measurement of Self-Resonance <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | Voltage-Time Product Rating 15.1 General Product Test Method Waveforms for Voltage-Time Product Test Method <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | 16 Shielding 16.1 Electronic Shielding Test Circuit for Rectangular Pulse Excitation Basic Electrostatic Symbol Shielded Single Winding Core Floating Multiple Shielded Single Winding Core Terminal (Lead) Provided <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | Shielded Two.Winding Secondary Core Grounded Shielded Group of Windings Core Floating Multiple Shielded Group of Windings Core Terminal (Lead) Provided Combination of Shielding Conditions Typical Two-Winding Shielded Transformer Simplified Representation of Fig <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | 16.2 Magnetic Shielding Indirect Measuring Method for Electronic Shielding <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | Measurement of Quality Factor Q 17.1 Definition 17.2 Methods 17.3 Bridge Measurements <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | 17.4 &-Meter Measurements 17.5 Transmission Method Circuit Magnification for Basic Method <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | Damped Oscillation Method Transmission Method <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | Damped Oscillation Method <\/td>\n<\/tr>\n | ||||||
56<\/td>\n | Oscilloscope Sweep for Damped Oscillation Method <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | Common-Mode Rejection Test Inrush-Current Evaluation and Measurement 19.1 Measurement 19.2 Calculation Common-Mode Rejection Test <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | 19.3 Other Considerations Current Transformer Test 20.1 General <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | Ratio and Phase Angle 21 Bibliography Test Circuit for Current Transformers <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | Inductors and Transformers General True rms Measurements <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | Flux Voltage Measurements Applications High-Potential Dielectric Testing General Leakage Current <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | Corona Test Equipment Requirement <\/td>\n<\/tr>\n | ||||||
63<\/td>\n | An AC Magnetic Field Pickup Probe <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Recommended Practice for Testing Electronic Transformers and Inductors<\/b><\/p>\n |