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UNE-EN 62374-1:2010:2011 Edition

$21.45

Semiconductor devices — Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Published By Publication Date Number of Pages
AENOR 2011-03-01 19
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Published Code

AENOR

Published By

Asociación Española de Normalización

Publication Date

2011-03-01

Pages Count

19

Language

English

File Size

532.5 KB

ICS Codes 31.080 - Semiconductor devices
UNE-EN 62374-1:2010
$21.45