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ASTM-F1893:2011 Edition

ASTM-F1893:2011 Edition

$40.63

F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

Published By Publication Date Number of Pages
ASTM 2011 7
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1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: ( 1 ) A survivability test, and ( 2 ) A burnout failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Terminology
2 Summary of Guide
Significance and Use
Interferences
3 Apparatus
5 Preparation of Apparatus
Procedure – Survivability Test
6 Procedure – Burnout Failure Level Test
Report
Keywords

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