BS 7317-6:1990

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Methods for analysis of high purity copper cathode Cu-CATH-1 – Method for determination of phosphorus and silicon by spectrophotometry

Published By	Publication Date	Number of Pages
BSI	1990	10

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Categories: 77.120.30 - Copper and copper alloys, BSI

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Description

This Part of BS 7317 describes a method for the determination of the actual amounts of the impurity elements phosphorus and silicon present in high purity copper cathode (designated Cu-CATH-1), by spectrophotometry. It is applicable to concentrations of the elements not exceeding the following limits:

NOTE The titles of the publications referred to in this Part of BS 7317 are listed on the inside back cover.

Applies to low levels in high purity copper cathode specified in BS 6017.

Additional information

Status	Confirmed
Title	Methods for analysis of high purity copper cathode Cu-CATH-1 – Method for determination of phosphorus and silicon by spectrophotometry
Replaces	DD 95-6:1987
Publisher	BSI
Committee	NFE/34
Pages	10
Silicon	25 µg/g (0.0025 % m/m) maximum.
Publication Date	1990-07-31
ISBN	0 580 18465 X
Standard Number	BS 7317-6:1990
Descriptors	Spectrophotometry, Purity, Complexing methods, Electrodes, Calibration, Copper, Reproducibility, Solvent extraction methods, Impurities, Cathodes, Silicon, Testing conditions, Determination of content, Trace element analysis, Phosphorus, Chemical analysis and testing
Phosphorus	20 µg/g (0.0020 % m/m) maximum;
ICS Codes	77.120.30 - Copper and copper alloys

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BS 7317-6:1990

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