BS EN 120000:1996

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Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices

Published By	Publication Date	Number of Pages
BSI	1996	276

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Description

Specifies quality assessment procedures,test methods and terminology required in the preparation of detailed specifications for optoelectronic and liquid crystal devices.

Additional information

Status	Definitive
Pages	276
Publication Date	1996-09-15
ISBN	0 580 26199 9
Standard Number	BS EN 120000:1996
Title	Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
Identical National Standard Of	EN 120000:1996
Replaces	BS CECC 20000:1983
Descriptors	Inspection, Performance testing, Voltage measurement, Semiconductor devices, Light-emitting diodes, Electronic equipment and components, Mechanical testing, Optical measurement, Quality assurance systems, Verification, Marking, Light-emitting devices, Phototransistors, Defects, Quality control, Approval testing, Designations, Couplers, Circuits, Capability approval, Light distribution, Test equipment, Electrical measurement, Visual inspection (testing), Specification (approval), Handbooks, Sampling methods, Resistance measurement, Current measurement, Assessed quality, Liquid crystal devices, Environmental testing, Statistical quality control, Optoelectronic devices, Qualification approval, Electrical testing, Testing conditions, Endurance testing, Photodiodes, Detail specification
Publisher	BSI
Committee	EPL/47
ICS Codes	31.260 - Optoelectronics. Laser equipment

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BS EN 120000:1996

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