BS EN 12544-2:2000

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Non-destructive testing. Measurement and evaluation of the X-ray tube voltage – Constancy check by the thick filter method

Published By	Publication Date	Number of Pages
BSI	2000	12

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Description

This standard specifies a constancy check of a X-ray system where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which can be changing due to ageing of the tube. The thick filter method is based on a measurement of the dose rate behind a defined thick filter using defined distances between the X-ray tube, the filter and the measuring device. This method is very sensitive to changes of the voltage, but it does not provide an absolute value for the X-ray tube voltage.

Additional information

Status	Withdrawn
Title	Non-destructive testing. Measurement and evaluation of the X-ray tube voltage – Constancy check by the thick filter method
Publisher	BSI
Committee	WEE/46
Pages	12
Publication Date	2000-06-15
Withdrawn Date	2020-03-19
Replaced By	BS EN ISO 16526-2:2020, BS EN ISO 16526-1:2020
ISBN	0 580 34178 X
Standard Number	BS EN 12544-2:2000
Identical National Standard Of	EN 12544-2:2000
Descriptors	Non-destructive testing, Voltage measurement, Filters, Constant-voltage sources, X-ray tubes, Radiographic testing, Voltage, X-ray apparatus
ICS Codes	19.100 - Non-destructive testing

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BS EN 12544-2:2000

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