BS EN 60679-1:2017
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Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Generic specification
Published By | Publication Date | Number of Pages |
BSI | 2017 | 42 |
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
7 | CONTENTS |
9 | FOREWORD |
11 | 1 Scope 2 Normative references |
12 | 3 Terms, definitions and general information 3.1 General 3.2 Terms and definitions |
14 | Figures Figure 1 – Basic configurations of SAW resonators |
16 | Figure 2 – Example of the use of frequency offset |
21 | Figure 3 – Linearity of frequency modulation deviation |
23 | Figure 4 – Characteristics of an output waveform |
24 | Figure 5 – Definition of start-up time Figure 6 – Clock signal with period jitter |
25 | Figure 7 – Phase jitter measures Figure 8 – Gaussian distribution of jitter Figure 9 – Jitter amplitude and period of jitter frequency |
26 | 3.3 Preferred values for ratings and characteristics 3.3.1 General Figure 10 – Jitter tolerance according to ITU-T G.825, ATIS-0900101,Telcordia GR-253 and ETSI EN 300 462 |
27 | 3.3.2 Climatic category (40/85/56) 3.3.3 Bump severity 3.3.4 Vibration severity 3.3.5 Shock severity 3.3.6 Leak rate |
28 | 3.4 Marking 3.4.1 General 3.4.2 Packaging 4 Quality assessment procedures 4.1 General 4.2 Primary stage of manufacture 4.3 Structurally similar components 4.4 Subcontracting |
29 | 4.5 Incorporated components 4.6 Manufacturer’s approval 4.7 Approval procedures 4.7.1 General 4.7.2 Capability approval 4.7.3 Qualification approval |
30 | 4.8 Procedures for capability approval 4.8.1 General 4.8.2 Eligibility for capability approval 4.8.3 Application for capability approval 4.8.4 Granting of capability approval 4.8.5 Capability manual 4.9 Procedures for qualification approval 4.9.1 General 4.9.2 Eligibility for qualification approval 4.9.3 Application for qualification approval 4.9.4 Granting of qualification approval |
31 | 4.9.5 Quality conformance inspection 4.10 Test procedures 4.11 Screening requirements 4.12 Rework and repair work 4.12.1 Rework 4.12.2 Repair work 4.13 Certified test records 4.14 Validity of release 4.15 Release for delivery |
32 | 4.16 Unchecked parameters |
33 | Annex A (normative) Load circuit for logic drive A.1 TTL and Schottky Figure A.1 – Circuit for TTL |
34 | Figure A.2 – Circuit for Schottky logic |
35 | A.2 CMOS A.3 ECL Figure A.3 – Circuit for PECL Tables Table A.1 – Values to be used when calculating R1 and R2 |
36 | A.4 LVDS Figure A.4 – Circuit for LVDS Table A.2 – Operating condition Table A.3 – DC Electrical characteristics output load = 50 Ω to Vcc-2V |
37 | Annex B (normative) Latch-up test B.1 Definition B.1.1 Latch-up B.1.2 Test procedure B.2 Test method |
38 | Annex C (normative) Electrostatic discharge sensitivity classification C.1 Definition C.1.1 Electrostatic discharge (ESD) C.1.2 Test procedure C.2 Test methods C.2.1 General C.2.2 Leaded oscillator C.2.3 SMD oscillator C.2.4 The impact of ESD on Oscillator in steady-state |
39 | Annex D (normative) Digital interfaced crystal oscillator’s function Table D.1 – Function of the digital interface |
40 | Bibliography |