BS EN 60749-1:2003

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Semiconductor devices. Mechanical and climatic test methods – General

Published By	Publication Date	Number of Pages
BSI	2003	12

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

Additional information

Status	Definitive
Pages	12
Publication Date	2003-07-07
ISBN	0 580 42198 8
Standard Number	BS EN 60749-1:2003
Title	Semiconductor devices. Mechanical and climatic test methods – General
Identical National Standard Of	EN 60749-1 (IEC 60749-1:2002) AS, IEC 60749-1:2002
Replaces	BS EN 60749:1999
Descriptors	Environmental testing, Testing conditions, Semiconductor devices, Integrated circuits, Mechanical testing, Electronic equipment and components, Climate
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-1:2003

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