BS EN 60749-24:2004

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Semiconductor devices. Mechanical and climatic test methods – Accelerated moisture resistance. Unbiased HAST

Published By	Publication Date	Number of Pages
BSI	2004	10

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Additional information

Status	Definitive
Pages	10
Publication Date	2004-06-24
ISBN	0 580 43972 0
Standard Number	BS EN 60749-24:2004
Title	Semiconductor devices. Mechanical and climatic test methods – Accelerated moisture resistance. Unbiased HAST
Identical National Standard Of	IEC 60749-24:2004, EN 60749-24:2004
Descriptors	Solid-state physics, Accelerated testing, Mechanical testing, Semiconductor devices, Accelerated corrosion tests, Moisture measurement, Climate, Temperature, Humidity, Performance testing, Corrosion resistance, Destructive testing, Electronic equipment and components, Damp-heat tests, Reliability, Environmental testing, Integrated circuits, Testing conditions
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-24:2004

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