BS EN 62276:2005 2006

$167.15

Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods

Published By	Publication Date	Number of Pages
BSI	2006	38

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Description

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Additional information

Status	Withdrawn
Title	Single crystal wafers applied for surface acoustic wave (SAW) device applications. Specification and measuring methods
Replaces	PD IEC/PAS 62276:2002
Publisher	BSI
Committee	W/-
Pages	38
Publication Date	2006-02-14
Withdrawn Date	2013-02-28
Replaced By	BS EN 62276:2013
ISBN	0 580 47074 1
Standard Number	BS EN 62276:2005
Identical National Standard Of	EN 62276:2005, IEC 62276:2005
Descriptors	Substrates (insulating), Acoustic measurement, Quartz, Crystals (electronic), Electromechanical filters, Acoustic waves, Dielectric devices, Acoustic filters, Electrical wave measurement, Acoustoelectric devices, Crystal resonators, Piezoelectric devices
ICS Codes	31.140 - Piezoelectric devices

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BS EN 62276:2005 2006

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