BS EN 62373:2006
$102.76
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
| Published By | Publication Date | Number of Pages |
| BSI | 2006 | 16 |
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
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