BS EN IEC 61124:2023
$215.11
Reliability testing. Compliance tests for constant failure rate and constant failure intensity
Published By | Publication Date | Number of Pages |
BSI | 2023 | 96 |
This International Standard gives a number of optimized test plans, the corresponding border lines and characteristics. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of – failure rate, – failure intensity, – mean operating time to failure (MTTF), – mean operating time between failures (MTBF), conforms to a given requirement. It is assumed, except where otherwise stated, that during the accumulated test time, the times to failure or the operating times between failures are independent and identically exponentially distributed. This assumption implies that the failure rate or failure intensity is assumed to be constant. Four types of test plans are described as follows: – truncated sequential probability ratio test (SPRT); – fixed time/failure terminated test (FTFT); – fixed calendar time terminated test without replacement; – combined test. This standard does not cover guidance on how to plan, perform, analyse and report a test. This information can be found in IEC 60300-3-5. This standard does not describe test conditions. This information can be found in IEC 60605-2 and in IEC 60300-3-5.
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | undefined |
5 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
6 | Blank Page |
7 | English CONTENTS |
11 | FOREWORD |
13 | INTRODUCTION |
15 | 1 Scope 2 Normative references |
16 | 3 Terms, definitions, abbreviated terms and symbols 3.1 Terms and definitions 3.2 Abbreviated terms and symbols 3.2.1 Abbreviated terms 3.2.2 Symbols |
18 | 4 General requirements and area of application 4.1 Requirements and characteristics 4.2 Applicability to replaced and repaired items |
19 | 4.3 Types of test plans 4.3.1 General 4.3.2 Advantages and disadvantages of the different test plan types |
20 | Tables Table 1 – Advantages and disadvantages for the different test plan types |
21 | 5 General test procedure 5.1 Test conditions Figures Figure 1 – Relative ETT (Te*/m0) and MaxTT (Tt*/m0) of various tests with the same risks |
22 | 5.2 General characteristics of the test plans 5.3 Data to be recorded 5.4 Calculation of accumulated test time, T* |
23 | 5.5 Number of failures 6 Truncated sequential probability ratio test (SPRT) plans 6.1 General |
24 | 6.2 Common test procedure 6.3 Decision criteria |
25 | 6.4 Operating characteristic (OC) curve Figure 2 – SPRT diagram and test example Table 2 – OC curve |
26 | 6.5 Expected accumulated test time to decision (ETT) Figure 3 – OC curve, Pa Table 3 – Relative ETT versus m/m0 |
27 | 6.6 Overview of test plans Figure 4 – SPRT – Curve of expected accumulated test time to decision (ETT) |
28 | Table 4 – Overview of type A SPRT plans |
30 | 7 Fixed time/failure terminated test plans – Fixed duration (to acceptance) test plans 7.1 General Table 5 – Overview of type C SPRT plans |
31 | 7.2 Common test procedure 7.3 Decision criteria 7.4 Test plans |
32 | 8 Design of alternative time/failure terminated test plans (FTFT) 8.1 General 8.2 Design procedures Table 6 – Type B FTFT plans |
33 | 8.3 Common FTFT procedure 8.4 Decision criteria 9 Calendar time/failure terminated test plans (FTFT) for non-replaced items 9.1 General |
34 | 9.2 Common test procedure 9.3 Decision criteria 9.4 Use of IEC 61123:2019, Table 5 for fixed calendar time tests 9.4.1 General |
35 | 9.4.2 Procedure when the test time is given 9.4.3 Procedure when the number of items is given 10 Combined test plans 10.1 General 10.2 Common test procedure |
36 | 10.3 Decision criteria 10.4 Test plans Figure 5 – Example of a decision graph for combinedtest plan (type D) and for SPRT type C |
37 | 11 Performing the test and presenting the results Table 7 – Overview of type D combined plans |
38 | Annex A (normative)Tables for border lines of SPRT plans (types A and C) A.1 Symbols A.2 Border lines |
39 | Figure A.1 – Decision graph of SPRT plan |
40 | Table A.1 – Constants for border line formulae and their coordinatesfor type A SPRT plans |
41 | Table A.2 – Constants for border line formulae and their coordinatesfor type C SPRT plans |
42 | A.3 Example of the SPRT plan from Clause 6 |
43 | Table A.3 – Example for SPRT using test plan A.41 (with example data) |
44 | Annex B (normative)Tables and graphs for combined test plans (type D) B.1 General Table B.1 – Combined test plans in Annex B |
45 | Table B.2 – Type D test plans – Accept and reject lines |
46 | B.2 Test plans D.3 and C.3 (α = β = 10 %, D = 1,7) Table B.3 – Expected accumulated test time to acceptance decision,Te*(+), for D and C test plans |
47 | Table B.4 – Accept and reject lines for D.3 and C.3 test plans |
48 | Figure B.1 – Expected accumulated test time to acceptance decision,Te*(+) for D.3 and C.3 test plans Figure B.2 – Operating characteristic Pa for D.3 and C.3 test plans |
49 | Annex C (informative)Extension of the set of SPRTs type A C.1 Symbols C.2 Extension of the set of type A tests (through interpolation by α and β ) |
51 | Table C.1 – Example for interpolation by α and β |
52 | Annex D (informative)Approximation of operating characteristic fortype A SPRTs by Wald’s formula D.1 Symbols D.2 Approximations of OC in this document D.3 Approximation of OC for type A SPRT by Wald’s formula |
53 | Figure D.1 – Approximation of OC for type A SPRT using Wald’s formula |
54 | D.4 Construction of the approximated OC curve using a spreadsheet |
55 | Table D.1 – Spreadsheet set-up for construction of the OC curve by Wald Table D.2 – Formulae embedded in the spreadsheet |
56 | Annex E (informative)Mathematical references and examples forfixed time/failure terminated test (FTFT) plans E.1 Symbols E.2 Mathematical references E.2.1 General E.2.2 Mathematical references |
59 | E.2.3 Design procedure {a} Table E.1 – List of the typical FTFT design procedures |
60 | E.2.4 Design procedure {b} E.2.5 Design procedure {c} |
61 | E.2.6 Design procedure {d} E.3 Examples of FTFT design using test plans B E.3.1 Example 1 |
62 | E.3.2 Example 2 Figure E.1 – Example 1 – Expected accumulated test timeto decision (ETT) of tests B.2 and A.25 |
63 | E.4 Test OC approximation using formula for FTFT Figure E.2 – Example 1 – Operating characteristic of tests B.2 and A.25 |
64 | Annex F (informative)Examples of FTFT design using a spreadsheet program F.1 General |
65 | Table F.1 – Set-up of the spreadsheet with embedded formulae |
66 | F.2 Finding the test border lines using optimization on the example of the design procedure {b} Table F.2 – Formulae embedded in the spreadsheet |
67 | Table F.3 – Fragment from Table 6 |
68 | F.3 ETT and OC curves Figure F.1 – Using Solver to find Tt*/m0 –Accumulated test truncation time in terms of m0 |
69 | Figure F.2 – ETT plotted from the spreadsheet calculations Figure F.3 – OC curve plotted from the spreadsheet calculations |
70 | F.4 Example of FTFT design by procedure {a} Table F.4 – Set-up 1 of the spreadsheet for example by procedure {a} |
71 | Figure F.4 – Using Solver to find Tt*/m0 and c in Step {a1} Table F.5 – Set-up 2 of the spreadsheet for example by procedure {a} |
72 | F.5 Example of FTFT design by procedure {c} Figure F.5 – Using Solver to find Tt*/m0 in Step {a2} Table F.6 – Set-up 3 (final solution) for example by procedure {a} |
73 | Table F.7 – Set-up 2 for example by procedure {c} |
74 | F.6 Example of FTFT design by procedure {d} Figure F.6 – Using Solver to find Tt*/m0 in Step {c2} Table F.8 – Set-up 3 (final solution) for example by procedure {c} |
75 | Table F.9 – Set-up 1 of the spreadsheet for example by procedure {d} |
76 | Figure F.7 – Using Solver to find D and c in Step {d1} Table F.10 – Set-up 2 of the spreadsheet for example by procedure {d} |
77 | F.7 Example of a test with replacement of failed items Figure F.8 – Using Solver to find D and Tt* in Step {d2} Table F.11 – Set-up 3 (final solution) for example by procedure {d} |
78 | F.8 Evaluation of an approximate OC for non-FTFT plans using a spreadsheet |
79 | Table F.12 – Set-up of the spreadsheet with embedded formulae from Clause F.8 |
80 | Figure F.9 – Using Solver to find c and Tt*/m0 from Clause F.8 Table F.13 – Set-up 1 of the spreadsheet from Clause F.8 |
81 | Table F.14 – Set-up 2 of the spreadsheet for example from Clause F.8 |
82 | Figure F.10 – OC approximated by formula for FTFT (example from Clause F.8) |
83 | Annex G (informative)Examples and mathematical references forthe calendar time terminated test plans G.1 Examples G.1.1 Example 1 G.1.2 Example 2 |
84 | G.2 Mathematical background |
85 | Annex H (informative)Derivation and mathematical reference for the optimized test plansof GOST R 27 402 [12] H.1 Symbols |
86 | H.2 Test plan types and terminology H.3 Introductory remarks Figure H.1 – Test plan types and terminology |
87 | H.4 Procedure used for developing the optimized test plans |
88 | Figure H.2 – Principle of test plans Figure H.3 – Partitioning of the test plan graph Figure H.4 – Interior nodes and border nodes |
89 | Figure H.5 – Paths to the accept line Figure H.6 – Paths to the reject line |
90 | Figure H.7 – Probabilities of paths transfer between nodes |
93 | Figure H.8 – Recurrent element – Two cases |
94 | Bibliography |