BS IEC 62528:2007

$215.11

Standard testability method for embedded core-based integrated circuits

Published By	Publication Date	Number of Pages
BSI	2007	126

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Description

Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.

Additional information

Status	Confirmed
Pages	126
Publication Date	2007-12-31
ISBN	978 0 580 59318 5
Standard Number	BS IEC 62528:2007
Title	Standard testability method for embedded core-based integrated circuits
Identical National Standard Of	IEC 62528:2007
Descriptors	Testing, Electronic engineering, Computer circuits, Microprocessor chips, Electronic equipment and components, Computer hardware, Integrated circuits
Publisher	BSI
Committee	EPL/501
ICS Codes	31.200 - Integrated circuits. Microelectronics

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BS IEC 62528:2007

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