BSI PD IEC/PAS 62277:2002
$102.76
Test-fixture of surface mounting quartz crystal units
Published By | Publication Date | Number of Pages |
BSI | 2002 | 16 |
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Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.
Status | Withdrawn |
---|---|
Title | Test-fixture of surface mounting quartz crystal units |
Publisher | BSI |
Committee | W/- |
Pages | 16 |
Publication Date | 2002-02-01 |
Withdrawn Date | 2003-11-19 |
Replaced By | BS EN 60444-8:2003 |
ISBN | 0 580 38979 0 |
Standard Number | PD IEC/PAS 62277:2002, IEC/PAS 62277:2001 |
Identical National Standard Of | IEC PAS 62277:2001 |
Descriptors | Calibration, Piezoelectric devices, Circuits, Electrical equipment, Frequencies, Dielectric devices, Electronic equipment and components, Crystals (electronic), Crystal resonators, Electrical properties and phenomena |
ICS Codes | 31.140 - Piezoelectric devices |
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