IEC 60749-43:2017
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Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans
| Published By | Publication Date | Number of Pages |
| IEC | 2017-06-15 | 78 |
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
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BS EN 60749-43:2017
Semiconductor devices – Mechanical and climatic test methods – Guidelines for IC reliability qualification plans…
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BS EN 60749-43:2017
Semiconductor devices – Mechanical and climatic test methods – Guidelines for IC reliability qualification plans…
