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IEC 62374:2007

IEC 62374:2007

$43.55

Semiconductor devices – Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Published By Publication Date Number of Pages
IEC 2007-03-29 46
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Provides a test method of Time Dependent Dielectric Breakdown

(TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

IEC 62374:2007
$43.55