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IEEE IEC 62539 2007

$91.54

IEC 62539 Ed.1 (IEEE Std 930 (TM)-2004): Guide for the Statistical Analysis of Electrical Insulation Breakdown Data

Published By Publication Date Number of Pages
IEEE 2007 53
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New IEEE Standard – Active. Abstract: This guide describes, with examples, statistical methods to analyze times to break down and breakdown voltage data obtained from electrical testing of solid insulating materials, for purposes including characterization of the system, comparison with another insulator system, and prediction of the probability of breakdown at given times or voltages. Remarks: IEC/IEEE Dual Logo Standard / Replaces IEEE Std 930-2004

PDF Catalog

PDF Pages PDF Title
5 CONTENTS
7 FOREWORD
9 Title Page
10 IEEE Introduction
11 1 Scope
2 References
12 3 Steps required for analysis of breakdown data
15 4 Probability distributions for failure data
4.1 The Weibull distribution
16 4.2 The Gumbel distribution
4.3 The lognormal distribution
4.4 Mixed distributions
17 4.5 Other terminology
5 Testing the adequacy of a distribution
5.1 Weibull probability data
5.1.1 Estimating plotting positions for complete data
18 5.1.2 Estimating plotting positions for singly censored data
5.1.3 Estimating plotting positions for progressively censored data
5.2 Use of probability paper for the three-parameter Weibull distribution
19 5.3 The shape of a distribution plotted on Weibull probability paper
5.4 A simple technique for testing the adequacy of the Weibull distribution
20 6 Graphical estimates of Weibull parameters
7 Computational techniques for Weibull parameter estimation
7.1 Larger data sets
21 7.2 Smaller data sets
22 8 Estimation of Weibull percentiles
9 Estimation of confidence intervals for the Weibull function
23 9.1 Graphical procedure for complete and censored data
9.1.1 Confidence intervals for the shape parameter, b
9.1.2 Confidence intervals for the location parameter, a
24 9.1.3 Confidence intervals for the Weibull percentiles
9.2 Plotting confidence limits
10 Estimation of the parameter and their confidence limits of the log-normal function
10.1 Estimation of lognormal parameters
25 10.2 Estimation of confidence intervals of log-normal parameters
11 Comparison tests
26 11.1 Simplified method to compare percentiles of Weibull distributions
12 Estimating Weibull parameters for a system using data from specimens
27 Annex A — Least squares regression
51 Annex B — Bibliography
52 Annex C — List of participants
IEEE IEC 62539 2007
$91.54