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ASTM-B651:1995 Edition

ASTM-B651:1995 Edition

$35.75

B651-83(1995) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope

Published By Publication Date Number of Pages
ASTM 1995 3
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ASTM B651-83-Reapproved1995

Historical Standard: Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope

ASTM B651

Scope

1.1 This method provides a means for measuring the average dimensions and number of corrosion sites in an electroplated decorative nickel plus chromium or copper plus nickel plus chromium coating on steel after the coating has been subjected to corrosion tests. The method is useful for comparing the relative corrosion resistances of different electroplating systems and for comparing the relative corrosivities of different corrosive environments. The numbers and sizes of corrosion sites are related to deterioration of appearance. Penetration of the electroplated coatings leads to appearance of basis metal corrosion products.

1.2 The values stated in SI units are to be regarded as the standard.

1.3 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

copper-nickel-chromium-electrodeposited coatings; corrosion-electrodeposited coatings; double-beam interference microscopy; electroplated coatings; electroplated coatings-chromium; electroplated coatings-nickel; microscopic examination-metallic/inorganic coatings; nickel-chromium alloys-electrodeposited; corrosion site measurement-nickel + chromium/copper + nickel + chromium; surfaces, by double-beam interference microscopy

ICS Code

ICS Number Code n/a

DOI: 10.1520/B0651-83R95

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