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ASTM-E1636:2004 Edition

ASTM-E1636:2004 Edition

$40.63

E1636-04 Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function

Published By Publication Date Number of Pages
ASTM 2004 7
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1.1 This practice covers a systematic method for analyzing sputter-depth-profile interface data and for accurately characterizing the shape of the interface region. Interface profile data are described with an appropriate analytic function; the parameters of this function define the interface width, its asymmetry, and its depth from the original surface. The use of this practice is recommended in order that the shapes of composition profiles of interfaces acquired with different instruments and techniques on different materials can be unambiguously compared and interpreted.

1.2 This practice is intended to be used to describe the shape of depth profile data obtained at an interface between two dissimilar materials for that case in which the measured concentration of the outer material goes from 100 to 0% and the inner material goes from 0 to 100%.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Terminology
Summary of Practice
Significance and Use
2 Description of the Analysis
Interpretation of Results
3 Reporting of Results
Example of Interface Profile Data Analysis Using the Method Suggested
Keywords
FIG. 1
4 X1. FITTING OF DEPTH PROFILE INTERFACE DATA TO THE LOGISTIC FUNCTION BY MEANS OF A SPECIALIZED COMPUTER ALGORITHM, LOGIT

X1.1 Scope
X1.2 Significance and Use
X1.3 Description of the Procedure, LOGIT
X1.4 Description of the Fitting Procedure Used in LOGIT
TABLE 1

5 X1.5 Analysis Procedure Using LOGIT
X1.6 Results of the Analysis
X1.7 Summary Demonstration of LOGIT
6 FIG. X1.1
FIG. X1.2

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