BS EN 61083-2:2013
$167.15
Instruments and software used for measurement in high-voltage and high-current tests – Requirements for software for tests with impulse voltages and currents
| Published By | Publication Date | Number of Pages |
| BSI | 2013 | 36 |
This part of IEC 61083 is applicable to software used for evaluation of impulse parameters from recorded impulse voltages and currents. It provides test waveforms and reference values for the software required to meet the measuring uncertainties and procedures specified in IEC 60060-1, IEC 60060-2, IEC 60060-3 and IEC 62475.
Hardware with built-in firmware that cannot accept external numerical input data is not covered by this standard.
The object of this standard is to
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establish the tests which are necessary to show that the performance of the software complies with the requirements of the relevant IEC standards;
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define the terms specifically related to digital processing;
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specify reference values and the acceptance limits for the reference impulses;
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specify the requirements for the record of performance;
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define the methods to assess the contribution of software to the measurement uncertainty.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 7 | INTRODUCTION |
| 8 | 1 Scope and object 2 Normative references |
| 9 | 3 Terms and definitions |
| 10 | Tables Table 1 – References to impulse voltage parameter definitions |
| 11 | 4 Test data generator (TDG) 4.1 Principle 4.2 Data format 5 Values and acceptance limits for the parameters of the reference impulses 6 Software testing 6.1 General Table 2 – References to impulse current parameter definitions |
| 12 | 6.2 Performance test 6.3 Uncertainty contribution for IEC 60060-2 and/or IEC 62475 |
| 13 | 7 Record of performance of the software Table 3 – Standard uncertainty contributions of software to the overall uncertainty according to the simplified procedure |
| 14 | Annex A (normative) Reference values and acceptance limits for the parameters of TDG impulses Table A.1 – Reference values and their acceptance limits for full lightning impulses (LI) (1 of 6) |
| 20 | Table A.2 – Reference values and their acceptance limits for chopped lightning impulses (LIC) (1 of 2) |
| 22 | Table A.3 – Reference values and their acceptance limits for switching impulses (SI) |
| 23 | Table A.4 – Reference values and their acceptance limits for current impulses (IC) (1 of 2) |
| 25 | Table A.5 – Reference values and their acceptance limits for oscillating lightning impulses (OLI) |
| 26 | Table A.6 – Reference values and their acceptance limits for oscillating switching impulses (OSI) |
| 27 | Annex B (informative) Alternative method for uncertainty estimation |
| 29 | Table B.1 – Expanded uncertainties (Ux) of the lightning impulse reference values (1 of 2) |
| 30 | Table B.2 – Expanded uncertainties (Ux) of the chopped lightning impulse reference values |
| 31 | Table B.3 – Expanded uncertainties (Ux) of the switching impulse reference values Table B.4 – Expanded uncertainties (Ux) of the impulse current reference values Table B.5 – Expanded uncertainties (Ux) of the oscillatinglightning impulse reference values |
| 32 | Table B.6 – Expanded uncertainties (Ux) of the oscillating switchingimpulse reference values Table B.7 – Example of uncertainty estimation |
| 34 | Bibliography |
