BS EN 62433-3:2017
$215.11
EMC IC modelling – Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 94 |
IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model – Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 7 | English CONTENTS |
| 11 | FOREWORD |
| 13 | 1 Scope 2 Normative references |
| 14 | 3 Terms, definitions, abbreviations and conventions 3.1 Terms and definitions |
| 15 | 3.2 Abbreviations 3.3 Conventions 4 Philosophy |
| 16 | 5 ICEM-RE macro-model description 5.1 General |
| 17 | 5.2 PDN description Figures Figure 1 โ General ICEM-RE model structure |
| 18 | Figure 2 โ Geometrical representation of the ICEM-RE PDN Figure 3 โ Representation of an elementary dipole in the ICEM-RE PDN |
| 19 | Figure 4 โ An elementary current loop of radius โaโ in 3D space Figure 5 โ Duality theorem between a current loop and a magnetic dipole |
| 20 | Figure 6 โ Example of referential points to describe the geometry Tables Table 1 โ PDN format |
| 21 | 5.3 IA description 5.4 Electromagnetic field calculation and simulation Figure 7 โ PDN definition at three different frequencies |
| 22 | 6 REML format 6.1 General |
| 23 | 6.2 REML structure Figure 8 โ REML inheritance hierarchy |
| 24 | 6.3 Global keywords 6.4 Header section |
| 25 | 6.5 Frequency definitions 6.6 Coordinate system definition |
| 26 | 6.7 Reference definition 6.8 Validity section 6.8.1 General |
| 27 | 6.8.2 Attribute definitions Table 2 โ Definition of the Validity section |
| 29 | 6.9 PDN 6.9.1 General |
| 30 | 6.9.2 Attribute definitions Table 3 โ Definition of the Submodel section of the Pdn element Table 4 โ Definition of the Vector keyword in the Pdn section |
| 31 | 6.9.3 PDN of a single-frequency ICEM-RE |
| 32 | Table 5 โ Valid fields of the Submodel keyword for single-frequency PDN Table 6 โ Conditions for correct annotation of single-frequency PDN by the REM parser Table 7 โ Valid fields of the Vector keyword for single-frequency PDN |
| 33 | Figure 9 โ Format for defining PDN vector data in an external file |
| 34 | 6.9.4 PDN for multi-frequency ICEM-RE Table 8 โ Valid file extensions in the Pdn section |
| 35 | Table 9 โ Conditions for correct annotation of multi-frequency PDN by the REM parser |
| 37 | 6.10 IA 6.10.1 General Table 10 โ Definition of the Submodel section of the Ia element |
| 38 | 6.10.2 Attribute definitions Table 11 โ Definition of the Vector keyword in the Ia section |
| 39 | 6.10.3 IA of a single-frequency ICEM-RE Table 12 โ Valid fields of the Submodel keyword for single-frequency IA Table 13 โ Conditions for correct annotation of single-frequency IA by the REM parser |
| 40 | Table 14 โ Valid fields of the Vector keyword for single-frequency IA |
| 41 | Figure 10 โ Format for defining IA vector data in an external file |
| 42 | 6.10.4 IA for multi-frequency ICEM-RE Table 15 โ Accepted file extensions in the Ia section Table 16 โ Conditions for correct annotation of multi-frequency IA by the REM parser |
| 43 | 7 Extraction 7.1 General |
| 44 | 7.2 Environmental extraction constraints 7.3 Obtaining model parameters from near-field data 7.3.1 General Figure 11 โ Electromagnetic field measurement |
| 45 | 7.3.2 PDN Figure 12 โ Bz field in nT measured at 3 mm above the microprocessor at 80 MHz |
| 46 | Figure 13 โ Example of electromagnetic field emitted by an elementary current line Figure 14 โ Manual current mapping |
| 47 | 7.3.3 IA Figure 15 โ Model representation with N automatically detected dipoles |
| 49 | Figure 16 โ Comparison between the modelled and measured EM fields at 2 mm above an oscillator |
| 50 | 7.4 Extraction based on ICEM-CE simulation 7.4.1 General 7.4.2 PDN Figure 17 โ A simple ICEM-CE PDN representing the package and the internal network impedance between the power rails |
| 51 | 7.4.3 IA 8 Validation Figure 18 โ Reconstructing the geometry of the package model (ICEM-RE PDN) from IBIS and its link with the electrical model (ICEM-CE PDN) |
| 52 | Figure 19 โ Graphical representation of the example validation procedure |
| 53 | Annex A (normative)Preliminary definitions for XML representation A.1 XML basics A.1.1 XML declaration A.1.2 Basic elements A.1.3 Root element A.1.4 Comments |
| 54 | A.1.5 Line terminations A.1.6 Element hierarchy A.1.7 Element attributes A.2 Keyword requirements A.2.1 General A.2.2 Keyword characters |
| 55 | A.2.3 Keyword syntax A.2.4 File structure |
| 56 | Figure A.1 โ Multiple XML files Figure A.2 โ XML files with data files (*.dat) |
| 57 | A.2.5 Values Figure A.3 โ XML files with additional files |
| 58 | Table A.1 โ Valid logarithmic units |
| 60 | Annex B (informative)Electromagnetic fields radiated by an elementary electric and magnetic dipole B.1 Electric dipole Figure B.1 โ An elementary current line in space |
| 62 | B.2 Magnetic dipole Figure B.2 โ Elementary magnetic dipole in space |
| 65 | Annex C (informative)Example files C.1 Minimum default ICEM-RE file |
| 66 | C.2 Microcontroller example in REML format Figure C.1 โ Microcontroller used for illustration |
| 67 | Figure C.2 โ Data file representing the PDN information of the microcontroller Figure C.3 โ Data file representing the IA information of the microcontroller |
| 68 | Annex D (normative)REML valid keywords and usage D.1 Root element keywords |
| 69 | D.2 File header keywords |
| 70 | D.3 Validity section keywords D.4 Global keywords |
| 71 | D.5 Pdn section keywords |
| 72 | D.6 Ia section keywords |
| 74 | Annex E (informative)ICEM-RE extraction methods E.1 General E.2 ICEM-RE Modelling methods E.2.1 ModelHman E.2.2 ModelH Figure E.1 โ Manually defined electric dipole array in ModelHman |
| 76 | E.2.3 ModelEM_Inv Figure E.2 โ Electric and magnetic dipole array in ModelEM_Inv |
| 77 | E.2.4 ModelEM_Iter E.2.5 ModelEM_TD |
| 78 | E.2.6 Model selection guide E.3 ICEM-RE modelling environment from near-field data E.3.1 General Table E.1 โ ICEM-RE model selection guide |
| 79 | E.3.2 Modelling design-flow Figure E.3 โ Example of an ICEM-RE modelling environment |
| 80 | E.3.3 ICEM-RE importation into 3D electromagnetic tools Figure E.4 โ ICEM-RE modelling design-flow |
| 81 | E.4 ICEM-RE modelling from ICEM-CE Figure E.5 โ Example of an imported ICEM-RE PDN and IA in a 3D simulation tool |
| 82 | Figure E.6 โ Design-flow to obtain ICEM-RE from ICEM-CE model |
| 83 | Annex F (informative)ICEM-RE model validation examples F.1 General F.2 Validation on a microcontroller F.2.1 General F.2.2 Details of the microcontroller F.2.3 Case 1: Choosing manual model ModelHman Figure F.1 โ Microcontroller circuit used for model validation |
| 84 | F.2.4 Case 2: Choosing one of the automatic magnetic field models Figure F.2 โ Manual dipoles representing the PDN of the microcontroller Figure F.3 โ Comparison between the modelled and measured fieldsat 4 mm above the microcontroller using ModelHman |
| 85 | Figure F.4 โ Validation of ModelH on the microcontroller Figure F.5 โ Detection of dipoles representing the microcontrollerusing ModelEM_Iter |
| 86 | F.3 Validation on an oscillator circuit Figure F.6 โ Validation of ModelEM_Iter on the microcontroller Figure F.7 โ Oscillator circuit used for model validation |
| 87 | Figure F.8 โ Schematic of the oscillator used for validation |
| 88 | Figure F.9 โ Validation of the magnetic field predicted with ModelEM_Inv and ModelEM_Iter on the oscillator at 10 mm height Figure F.10 โ Validation of the electric field predicted with ModelEM_Inv and ModelEM_Iter on the oscillator at 10 mm height |
| 89 | F.4 Example of validation on passive devices Figure F.11 โ Modelled maximum total magnetic field as a function of height (z)above the oscillator compared with measurements |
| 90 | F.5 Examples of validation on active devices F.5.1 Extraction from near-field measurements F.5.2 Extraction from ICEM-CE model Table F.1 โ ICEM-RE model validation on passive structures |
| 91 | Annex G (informative)ICEM-RE macro-model usage examples G.1 General G.2 Methodology for exploiting ICEM-RE macro-model |
| 92 | Figure G.1 โ Typical EMC issues at equipment and system level covered by ICEM-RE |
| 93 | Bibliography |
