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BS EN IEC 61788-17:2021 – TC:2022 Edition

BS EN IEC 61788-17:2021 – TC:2022 Edition

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Tracked Changes. Superconductivity – Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films

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BSI 2022 116
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IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows. – Jcd: from 200 A/m to 32 kA/m (based on results, not limitation). – Measurement resolution: 100 A/m (based on results, not limitation).

PDF Catalog

PDF Pages PDF Title
1 30451912
69 A-30391555
70 undefined
73 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
75 CONTENTS
77 FOREWORD
79 INTRODUCTION
81 1 Scope
2 Normative references
3 Terms and definitions
82 4 Requirements
83 5 Apparatus
5.1 Measurement equipment
Figures
Figure 1 – Diagram for an electric circuit usedfor inductive Jc measurement of HTS films
84 5.2 Components for inductive measurements
Figure 2 – Illustration showing techniques to press the sample coil to HTS films
85 6 Measurement procedure
6.1 General
6.2 Determination of the experimental coil coefficient
Figure 3 – Example of a calibration wafer used to determine the coil coefficient
86 Figure 4 – Illustration of the sample coil and the magnetic field during measurement
87 Figure 5 – Illustration of the sample coil and its magnetic field generation
Tables
Table 1 – Specifications and theoretical coil coefficients k of sample coils
89 6.3 Measurement of Jc in sample films
6.4 Measurement of Jc with only one frequency
Figure 6 – E-J characteristics measured by a transport methodand the U3 inductive method
90 6.5 Examples of the theoretical and experimental coil coefficients
Figure 7 – Illustration of coils 1 and 3 in Table 2
Table 2 – Specifications and coil coefficients of typical sample coils
91 7 Uncertainty in the test method
7.1 Major sources of systematic effects that affect the U3 measurement
Figure 8 – The coil-factor function F(r) = 2H0/I0 calculated for the three coils
92 7.2 Effect of deviation from the prescribed value in the coil-to-film distance
Figure 9 – The coil-to-film distance Z1 dependenceof the theoretical coil coefficient k
93 7.3 Uncertainty in the experimental coil coefficient and the obtained Jc
7.4 Effects of the film edge
7.5 Specimen protection
94 8 Test report
8.1 Identification of test specimen
8.2 Report of Jc values
8.3 Report of test conditions
95 Annex A (informative) Additional information relating to Clauses 1 to 8
97 Figure A.1 – Illustration of the sample coil andthe magnetic field during measurement
99 Figure A.2 – U3 and U3/I0 plotted against I0 in a YBCO thin film measured in applied DC magnetic fields, and the scaling observed when normalized by Ith (insets)
Figure A.3 – Example of the normalized third-harmonicvoltages (U3/fI0) measured with various frequencies
101 Annex B (informative) Optional measurement systems
102 Figure B.1 – Schematic diagram for the variable-RL-cancel circuit
Figure B.2 – Diagram for an electrical circuit used for the two-coil method
103 Figure B.3 – Harmonic noises arising from the power source
Figure B.4 – Noise reduction using a cancel coil with a superconducting film
104 Figure B.5 – Normalized harmonic noises (U3/fI0) arising from the power source
Figure B.6 – Normalized noise voltages after the reductionusing a cancel coil with a superconducting film
105 Figure B.7 – Normalized noise voltages after the reductionusing a cancel coil without a superconducting film
Figure B.8 – Normalized noise voltages with the two-coil system shown in Figure B.2
106 Annex C (informative) Evaluation of the uncertainty
107 Table C.1 – Uncertainty budget table for the experimental coil coefficient k′
109 Table C.2 – Examples of repeated measurements of Jc and n-values
111 Figure C.1 – Effect of the coil position against a superconductingthin film on the measured Jc values
112 Bibliography

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BS EN IEC 61788-17:2021 - TC
$246.62