BS IEC 62047-40:2021

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Semiconductor devices. Micro-electromechanical devices – Test methods of micro-electromechanical inertial shock switch threshold

Published By	Publication Date	Number of Pages
BSI	2021	14

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Categories: 31.080.99 - Other semiconductor devices, BSI

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CONTENTS

FOREWORD

1 Scope
2 Normative references
3 Terms and definitions

Figures
Figure 1 – The schematic drawing of micro-electromechanical inertia shock switch

4 Essential ratings and characteristics
4.1 Recommended operating condition
4.2 Characteristics
5 Test items and methods
5.1 Switch type
5.2 Static threshold
5.2.1 Test method 1
Figure 2 – Test system 1 of static threshold
Tables
Table 1 – Characteristics of the switch threshold

5.2.2 Test method 2
Table 2 – Test parameters of static threshold

Figure 3 – Test system 2 of static threshold

5.3 Dynamic threshold
5.3.1 Test system
Figure 4 – Circuit diagram of switch
Figure 5 – Static threshold of switch
Figure 6 – Test system of dynamic threshold

5.3.2 Test procedure
Table 3 – Test parameters of dynamic threshold

Status	Definitive
Pages	14
Publication Date	2021-09-14
ISBN	978 0 539 07033 0
Standard Number	BS IEC 62047-40:2021
Title	Semiconductor devices. Micro-electromechanical devices – Test methods of micro-electromechanical inertial shock switch threshold
Identical National Standard Of	IEC 62047-40 Ed.1.0
Descriptors	Test methods, Semiconductor technology, Electronic equipment and components, Electromechanical devices, Semiconductor devices, Integrated circuits
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.99 - Other semiconductor devices


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