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BSI 24/30465997 DC 2024

BSI 24/30465997 DC 2024

$13.70

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

Published By Publication Date Number of Pages
BSI 2024 34
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Status

Definitive
Pages

34
Publication Date

2024-01-15
Standard Number

24/30465997 DC
Title

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Identical National Standard Of

ISO 17297
Publisher

BSI
Committee

CII/9
ICS Codes 01.040.37 - Image technology (Vocabularies)

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BSI 24/30465997 DC 2024
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