BSI PD CEN/TS 17010:2016:2017 Edition
$215.11
Nanotechnologies. Guidance on measurands for characterising nano-objects and materials that contain them
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 78 |
This Technical Specification provides guidelines for the identification of measurands to characterize nanoobjects, and their agglomerates and aggregates and to assess specific properties relevant to the performance of materials that contain them. It provides guidance for relevant and reliable measurement.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 4 | Contents Page |
| 9 | European foreword |
| 10 | Introduction |
| 11 | 1 Scope 2 Normative references 3 Terms and definitions |
| 12 | 3.1 General core terms 3.2 Measurand terms |
| 17 | 4 Symbols and abbreviations |
| 19 | 5 Approaches to identify measurands to characterize nano-objects and their agglomerates and aggregates, and materials containing nano-objects 5.1 Method 5.2 Types of measurands |
| 20 | 5.3 State of nano-objects Table 1 —Different states of Nano-objects 6 Measurands related to size and shape measurement of nano-objects and their agglomerates and aggregates 6.1 Introduction |
| 21 | 6.2 Measurands related to size and shape measurement 6.3 Measurands related to size and shape measurement in aerosols 6.3.1 Overview |
| 22 | Table 2 — Measurands related to the size and shape measurement in aerosols |
| 23 | 6.3.2 General relevant standard 6.3.3 Electrical low-pressure impaction (ELPI) |
| 24 | 6.3.4 Cascade impactors 6.3.5 Differential mobility analysing system (DMAS) 6.3.6 Relevant standards |
| 25 | 6.3.7 Optical Particulate Counters (OPC) 6.3.8 Relevant standards 6.3.9 Aerodynamic Particle Sizing (APS) 6.3.10 Transmission electron microscopy (TEM) combined with TEM grid samplers |
| 26 | 6.3.11 Relevant standards 6.3.12 Scanning electron microscopy (SEM) 6.3.13 Relevant standards |
| 27 | 6.4 Measurands related to size and shape measurement in powders 6.4.1 Overview Table 3 — Measurands related to the size and shape measurement in powders |
| 28 | 6.4.2 Relevant standards 6.4.3 Scanning electron microscopy (SEM) 6.4.4 Relevant standards 6.4.5 Gas adsorption, the BET method 6.4.6 Relevant standards 6.4.7 Laser diffraction (LD) |
| 29 | 6.4.8 Relevant standards 6.4.9 X-ray diffraction (XRD) 6.4.10 Relevant standards 6.4.11 Raman spectroscopy 6.5 Measurands related to size and shape measurements of nano-objects in liquid dispersions 6.5.1 Overview |
| 30 | Table 4 — Measurands related to the size and shape measurement in liquids |
| 31 | 6.5.2 Centrifugal liquid sedimentation (CLS) 6.5.3 Relevant standards |
| 32 | 6.5.4 Dynamic light scattering (DLS) 6.5.5 Relevant standards 6.5.6 Laser diffraction (LD) 6.5.7 Relevant standards 6.5.8 Small angle X-ray scattering (SAXS) |
| 33 | 6.5.9 Relevant standards 6.5.10 Particle tracking analysis (PTA) 6.5.11 Relevant standards 6.5.12 Electron microscopy 6.6 Measurands related to size and shape measurement on surfaces (microscopy techniques) 6.6.1 Overview |
| 34 | Table 5 — Measurands related to the size and shape measurement on surfaces 6.6.2 Scanning electron microscopy (SEM) 6.6.3 Atomic force microscopy (AFM) |
| 35 | 6.6.4 Relevant standards 7 Measurands related to chemical analysis of nano-objects and their agglomerates and aggregates 7.1 Introduction |
| 36 | 7.2 Measurands related to surface chemical analysis of nano-objects and their agglomerates and aggregates 7.2.1 Measurands Table 6 — Measurands related to the surface chemical analysis of nano-objects and their agglomerates and aggregates |
| 37 | 7.2.2 Auger electron spectroscopy (AES) 7.2.3 Relevant standards |
| 38 | 7.2.4 Electron energy loss spectroscopy (EELS) 7.2.5 Relevant standards 7.2.6 Secondary ion mass spectroscopy (SIMS) 7.2.7 Relevant standards 7.2.8 X-ray fluorescence spectroscopy (XRF) |
| 39 | 7.2.9 Relevant standards 7.2.10 X-ray diffraction (XRD) 7.2.11 Relevant standards |
| 40 | 7.2.12 X-ray photoelectron spectroscopy (XPS) 7.2.13 Relevant standards 7.2.14 Energy dispersive X-ray spectroscopy (EDS or EDX) |
| 41 | 7.3 Measurands related to the chemical analysis of nano-objects as bulk samples 7.3.1 Measurands Table 7 — Measurands related to the chemical analysis of nano-objects and their agglomerates and aggregates |
| 43 | 7.3.2 Differential scanning calorimetry (DSC) 7.3.3 Relevant standards 7.3.4 Fourier transform infrared spectroscopy (FTIR) |
| 44 | 7.3.5 Relevant standards 7.3.6 Thermal analysis with evolved gas analyser (EGA) plus FTIR or QMS 7.3.7 Relevant standards 7.3.8 Ultraviolet–visible spectroscopy (UV-Vis) |
| 45 | 7.3.9 Relevant standards 7.3.10 Raman spectroscopy 7.3.11 Inductively coupled plasma (ICP) techniques 7.3.12 Contact Angle 8 Measurands related to mass and density 8.1 Introduction |
| 46 | 8.2 Aerosols 8.2.1 Measurands Table 8 — Measurands associated with mass and density measurement of nano-objects in an aerosol 8.2.2 Relevant standards 8.2.3 Aerosol particle mass analyser (APM) 8.2.4 Time of flight mass spectrometry |
| 47 | 8.3 Powders 8.3.1 Measurands Table 9 — Measurands associated with mass and density measurement of nano-objects in powder form 8.3.2 Pycnometry 8.3.3 Relevant standards 8.4 Liquid dispersions 8.4.1 Measurands |
| 48 | Table 10 — Measurands related to mass and density for nano-objects in liquid dispersions 8.4.2 Relevant standards 8.4.3 Centrifugal liquid sedimentation (Isopycnic method) |
| 49 | 8.4.4 Static light scattering (SLS) 8.4.5 Resonant mass measurement (RMM) 9 Measurands related to charge – Liquid dispersions 9.1 Measurands Table 11 — Measurands related to charge |
| 50 | 9.2 Relevant standards 9.3 Electrophoretic light scattering 9.4 Electroaccoustic phenomena measurements 10 Measurands related to crystallinity 10.1 Measurands |
| 51 | Table 12 — Measurands related to crystallinity |
| 52 | 10.2 Small-angle/wide-angle X-ray scattering (SAXS/WAXS) 10.3 X-ray diffraction (XRD) 10.4 Scanning/ electron microscopy (SEM) |
| 53 | 10.5 High-resolution transmission electron microscopy (HRTEM) 10.6 Electron diffraction 10.7 Neutron diffraction 10.8 Electron backscatter diffraction (EBSD) 10.9 Reflection high-energy electron diffraction (RHEED) and low-energy electron diffraction (LEED) |
| 54 | 10.10 Differential scanning calorimetry (DSC) 10.11 Nuclear magnetic resonance (NMR) crystallography 10.12 Raman crystallography 10.13 Relevant standards 11 Optical properties measurands 11.1 Introduction 11.2 Measurands |
| 55 | Table 13 — Measurands for optical properties 11.3 Spectroscopy techniques |
| 56 | 11.4 Relevant standards 12 Electrical and electronic measurands 12.1 Measurands |
| 57 | Table 14 — Measurands related to electrical and electronic measurements |
| 58 | 12.2 Techniques 12.2.1 2 or 4 point conductance measurements 12.2.2 Angle-resolved ultraviolet photoemission spectroscopy (ARPES) 12.2.3 Scanning tunnelling microscopy (STM) 12.2.4 Conductive atomic force microscopy 12.2.5 Piezoforce microscopy (PFM) |
| 59 | 13 Magnetic measurands 13.1 Introduction 13.2 Measurands Table 15 —Measurands related to magnetic properties of solid nano-composite materials |
| 60 | 13.3 Techniques 13.3.1 Superconducting quantum interference device (SQUID) |
| 61 | 13.3.2 Vibrating sample magnetometer (VSM) 13.3.3 Mössbauer spectroscopy 13.3.4 Electron paramagnetic resonance (EPR) spectroscopy 13.3.5 Magneto-optical Kerr-effect (MOKE) 13.3.6 Magnetic force microscopy (MFM) 13.3.7 Scanning Hall effect microscopy |
| 62 | 13.3.8 Spin-polarized scanning tunnelling microscopy (SP-STM) 13.3.9 Relevant standards 14 Thermal measurands 14.1 Measurands |
| 63 | Table 16 — Measurands related to thermal properties 14.2 Techniques 14.2.1 Measurement of specific heat capacity 14.2.2 Scanning thermal microscopy (SThM) |
| 64 | 15 Other performance related measurands 15.1 Introduction 15.2 Powders – Dustiness Table 17 — Measurands related to Dustiness |
| 65 | 15.3 Liquid dispersions 15.3.1 Introduction Table 18 — Measurands related to properties of suspension of nano-objects in liquids 15.3.2 Viscosity 15.3.2.1 Overview |
| 66 | 15.3.2.2 Rotational viscometer 15.3.2.3 Gravimetric capillary principle 15.3.2.4 Rolling or falling ball principle 15.3.2.5 Rheometry 15.3.2.6 Relevant standards |
| 67 | 15.3.3 Dispersibility 15.3.4 Relevant standards 15.3.5 Solubility and rate of dissolution |
| 68 | 15.3.6 Relevant standards 15.4 Mechanical properties 15.4.1 Introduction |
| 69 | Table 19 — Measurands related to mechanical properties of solid nano-composite materials |
| 70 | 15.4.2 Measurement of elastic constants by static methods 15.4.3 Relevant standards 15.4.4 Measurement of elastic constants by dynamic methods 15.4.5 Relevant standards 15.4.6 Measurement of elastic and plastic properties by instrumented indentation methods |
| 71 | 15.4.7 Relevant standards 15.4.8 Measurement of surface properties and wear 15.4.9 Relevant standards |
| 72 | Bibliography |
