IEEE 1226.2 1994

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IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))

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IEEE	1994	426

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Description

New IEEE Standard – Inactive – Withdrawn. Ada packages that specify data types and services for the Ada-based ATLAS-level test procedure interface for a broad-based environment for test (ABBET) are defined. They are to be used to support the development of Ada- based, UUT-directed, signal-oriented test programs. IEEE ABBET uses the features of Ada to specify a comprehensive environment for integrating product design data, test requirements/strategies, and test results management in the implementation of automated test systems and test control programs.

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PDF Pages	PDF Title
15	1.0verview 1.1scope 1.2 purpose 1.3 Application
16	2.References
18	3.Definitions 3.1Keyterms 3.2 Abbreviations and acronyms
19	4.Description 4.1 Objectives 4.2 Overview Figure l-Hardware and software transition from UUT to instrument
20	4.2.1 Test Resources and Classes 4.2.2 Ada implementation of the resource classes and objects
21	4.2.3 Links between object classes 4.2.4 Structural overview of analog resources
22	4.2.5 Structural overview of digital resources 4.2.6 Data bus testing structure Figure 2-Structural overview of analog resources
23	4.2.7 Resource allocation Figure 3-Structural overview of digital resources Figure 4-Data bus testing structure
24	4.3 Relationship to ABBET architecture Figure 5-ABBET architecture as defined in IEEE Std 1226-1993
25	4.3.1 ABBET conforming implementations Figure GABBET test and diagnostic services
26	4.4 Relationship to reference documents Figure 7-Layered implementation of ABBET ALTPI and lower-level interfaces
28	5.1 Test program structure 5.1.1 Program components 5.1.2 Test labeling
29	5.1.3 Test encapsulation
31	5.1.4 Multitasking support 5.1.5 Required resome instantiation
33	5.1.6 Test program elaboration Figure 8-ALTPI package elaboration order diagram ANALOG-SIGNAL-MONITOR-CAPABILITY
35	5.1.7 Status flag operations
37	5.1.8 Test completion 5.2 Data processing 5.2.1 Authorized characters 5.2.2 Number representations
38	5.2.3 Scope of identifiers 5.2.4 Program control 5.2.5 Computational operations 5.2.6 Mathematical operations 5.2.7 Digital data operations
39	5.2.8 ABBET standard physical units 5.2.9 Physical data conversions
40	5.3 InpuVoutput 5.3.1 File input/output 5.3.2 Operator input/output 5.4 Connection path requirements 5.4.1 Pin descriptors
43	5.4.2 Connection identifiers
46	5.4.3 Path description
49	5.4.4 Connection error exception 5.5 Resource capability requirements 5.5.1 ANALOG-SENSOR-CAPAsILITY
50	5.5.2 ANALOG-SOURCECAPABILITY
51	5.5.3 SIMPLE-LOAD-CAPABILITY 5.5.4 TIME_INTERVAL-SENSOR_CAPABILITY 5.5.5 TIMER-SOURCE-CAPABILITY
52	5.5.6 DIGITAL-SENSOR-CAPABILITY 5.5.7 DIGITAL-SOURCE-CAPABILITY
53	5.6 Event monitor capability 5.6.1 ANALOG-SIGNAL-MONITOR-CAPABILITY 5.6.2 ANALOG-TIME-MO-R-CAPABILITY
54	5.6.4 DIGITAL-EVENT-MONITOR-CAPABILm 5.7 Event monitor resources 5.7.1 ANALOG-SIGNAL-MONITOR
55	5.7.2 ANALOG-TIME-MONITOR 5.7.3MANUAL-INTERVENTION
56	5.7.4 DIGITAL-EVENT-MONITOR 5.8 UUT-directed virtual resources
58	5.8.1 ANALOG-SENSOR
60	5.8.2 ANALOG-SOURCE
62	5.8.3 SIMPLE-LOAD
63	5.8.4 TIME-INTERVALSENSOR
64	PRIMARY-DATA-BUS
65	5.8.5 TIMER-SOURCE
66	5.8.6 DIGITAL-SENSOR DO-DATA-BUS-EXCHANGE
67	5.8.7 DIGITAL-SOURCE ABBET-EVALUATIONS
68	5.9 Signal oriented procedures
69	VIRTUAL-RESOURCE-GROUP
70	5.9.1 State transition diagrams Figure 9-State diagram for a virtual analog source or load resource without event monitor
71	Figure 1O-State diagram for a virtual analog source or load resource with an event monitor ATLAS-CONTROL
72	Figure 11Ptate diagram for a virtual analog Sensor without event monitor
73	Figure 12State diagram for a virtual analog Sensor with an event monitor
76	5.9.2 Single-action verbs
77	Figure 13Single action verb illustration
81	5.9.3 Multiple action verbs
84	5.9.4 Digital verbs
88	5.9.5 ANTICIPATE-VIA-CONNECTION Procedure
89	5.10 Test timing and synchronization procedures 5.10.1 Timer Source WAIT and RESET procedures
90	5.10.2 RESET-ALL-TIMERS RESET-TIMERS 5.10.3 DOSIMULTANEOUS 5.10.4 DO-TIMED-DIGITAL
92	5.10.5 STIM-RATE-ONLY 5.10.6 STIM-EVENT-ONLY
93	5.10.7 STIM-UTE-AND-SENSE-DELAY 5.10.8 STIM-RATE-AND-SENSE-EVENT 5.10.9 STIM-EVENT-AND-SENSE-DELAY
94	5.10.10 STIM-EVENT-AND-SENSE-EVENT 5.10.11 SENSE-RATE-ONLY
95	5.10.12 SENSE-EVENT-ONLY 5.1 1 Digital bus testing procedures
96	Figure 14-Example single 1553B bus interfacing Several avionics systems
98	5.12 Fiel4subfield data definitions
99	5.12.1 ATLAS-TYPES
111	5.12.2 NOUN-MODIFIER_TYPES
118	5.12.3 RESOURCE-DESCRIPTION
121	5.12.4 SIGNAL-DESCRIPTION
129	5.12.5 SYNCHRONIZATION-TYPES
137	5.12.7 DIGITAL-DESCRIPTION
149	5.12.8 DATABUS-DESCRIPTION
158	5.13 Nouns and their modifiers 5.13.1 Standard ATLAS nouns
160	5.13.2 AC-SIGNAL (alternating current signal)
161	5.13.3 ADF (Automatic direction finder)
162	5.13.4 AM-SIGNAL (Amplitude modulation signal) 5.13.5 AMBIENT-CONDITIONS
164	5.13.6 ATC (Air traffic control)
165	Figure 16-ATC interrogation signal Figure 17-ATC reply signal
166	5.13.7 COMMON
168	5.13.8 DC-SIGNAL (Direct current signal) 5.13.9 DISPLACEMENT 5.13.10 DME (Distance measuring equipment)
169	5.13.11 DOPPLER
170	5.13.12 EARTH
171	5.13.13 EM-FIELD (Elect10 magnetic field) 5.13.14 EVENTS
172	5.13.15 FLUID-SIGNAL
174	5.13.16 FM-SIGNAL (Frequency modulation signal) 5.13.17 HEAT Identification. friend or foe)
176	5.13.19 ILS (Instrument landing system)
178	5.13.2 IMPEDANCE 5.13.21 LIGHT 5.13.22 LOGIC-CONTROL
179	5.13.23 LOGIC-DATA
187	5.13.24 LOGIC-LOAD Figure 18Defined voltage ranges for these examples
188	5.13.25 LOGIC-REFERENCE
189	5.13.26 MANOMETRIC 5.13.27 PAM (Pulse amplitude modulation)
190	5.13.28 PM-SIGNAL (Phase modulated signal) 5.13.29 PULSED-AC (Pulsed alternation current signal)
191	5.13.30 PULSED-AC-TRAIN
192	Figure 19-Pulsed ac train for example Figure 2CLPulsed ac train for example
193	5.13.31 PULSED-DC 5.13.32 PULSED-DC-TRAIN
194	Figure 21-Pulsed dc train for example Figure 22-Pulsed dc train for example
195	5.13.33 PULSED-DOPPLER 5.13.34 RADAR-SIGNAL
196	5.13.35 W-SIGNAL 5.13.36 RANDOM-NOISE 5.13.37 RESOLVER
197	5.13.38 ROTATION Figure 23-Inertially (Earth) stabilized coordinate frame
198	Figure 24WT referenced stabilized coordinate frame
199	Figure 25Rotation quantity rate and acceleration illustration
200	Figure 26-Upside-down missile UUT heading north
201	5.13.39 SHORT 5.13.40 SQUARE-WAVE
202	5.13.41 SW-SIGNAL 5.13.42 SUP-CAR-SIGNAL (Suppressed carrier signal)
203	5.13.43 SYNCHRO 5.13.44 TACAN (Tactical air navigation)
207	5.13.45 TIME-INTERVAL 5.13.46 TRIANGULAR-WAVE-SIGNAL 5.13.47 TURBINE-ENGINE-DATA
208	5.13.48 VIBRATION
209	5.13.49 VOR (VHF omnidirectional radio range)
210	5.13.50 WAVEFORM
211	Figure 27Definition of waveform period sample-time and sample-width
212	Figure 28-Example waveform with voltage samples
213	5.14 Noun modifiers Figure 29-Voltage stepped and ramped waveforms
215	5.14.1 Identifiers for pulse-type signals 5.14.2 Standard ATLAS noun modifiers
216	Figure 30-Modifiers used with pulse-type signals
220	5.14.3 Standard ATLAS noun modifier prefixes 5.14.4 Standard ATLAS noun modifier suffixes
224	Figure 31Deak and peak-to-peak characteristics for voltage waveforms
225	Figure 32-Instantaneous voltage characteristics
227	5.14.5 Standard noun modifier enumeration values
228	5.14.6 Modifier value descriptors
229	5.14.7 Noun modifier definitions
251	Figure 33Defmed voltage ranges for the example
253	6.Conformance 6.1 Ada language capabilities 6.2 ABBET test pmedure language capabilities 6.3 Subsets and extensions 6.3.1 Supported nouns modifiers and connections
259	6.3.2 Reusable higher-level test procedure components
260	7.AdaPackages
262	7.1 ATLAS-TYPES package specification
271	7.2 NOUN-MODIFIER-TYPES package specification
278	7.3 SIGNAL-DESCRIPTION package specification
287	7.4 RESOURCE-DESCRIPTION package specification
290	7.5 EVENT-DESCRIPTION package specification
292	7.6 DIGITAL-DESCRIPTION package specification
298	7.7 PATH-DESCRIPTION package specification
301	7.8 SYNCHRONIZATION-TYPES package specification
306	7.9 ATLAS-NOUNS-MODIFIERS-AND-CONNECTIONS package specification
319	7.10 ANALOG-SENSOR-CAPABILITY package specification
320	7.1 1 ANALOGSOURCE-CAPABILITY package specification
321	7.12 SIMPLE-LOAD-CAPABILITY package specification
322	7.13 TIME-INTERVAL-SENSOR_CAPABILITY package specification
323	7.14 TIMER-SOURCE-CAPABILITY package specification
324	7.15 ANALOG-SENSOR package specification
327	7.16 ANALOG-SOURCE package specification
329	7.17 SIMPLE-LOAD package specification
331	7.18 Tm-INTERVAL-SENSOR package specification
333	7.19 ANALOG-SIGNAL-MONiTOR-CAP&ILITY package specification
334	7.20 ANALOG-TIME-MONITOR-CAPABILITY package specification ANALOG-TIME-MONITOR-CAPABILITY
335	7.21 MANUAL-INTERVENTION-CAPABILITY package specification MANUAL-INTERVENTION-CAPABILITY
336	7.22 ANALOG-SIGNAL-MONITOR package specification ANALOG-SIGNAL-MONITOR
337	7.23 ANALOG-TIME-MONITOR package specification ANALOG-TIME-MONITOR
338	7.24 MANUAL-INTERVENTION package specification MANUAL-INTERVENTION
339	7.25 DIGITAL-EVENT-MONITOR-CAPABILITY package specification
340	7.26 DIGITAL-SENSOR-CAPABILITY package specification DIGITAL-SENSOR-CAPABILITY
341	7.27 DIGITAL-SOURCE-CAPABILITY package specification DIGITAL-SOURCE-CAPABILITY
342	7.28 DIGITAL-EVENT-MONITOR package specification DIGITAL-EVENT-MONITOR
343	7.29 DIGITAL-SENSOR package specification DIGITAL-SENSOR
345	7.30 DIGITAL-SOURCE package specification DIGITAL-SOURCE
346	7.31 TIMER-SOURCE package specification TIMER-SOURCE
347	7.32 SIMULTANEOUS-DIGITAL package specification DO-SIMULTANEOUS
348	7.33 DO-TIMED-DIGITAL package specifications A set of DO-TIMED-DIGITAL packages
353	7.34 DATABUS-DESCRIPTION package specification DATA-BUS-DESCRIPTION
363	7.35 EXCHANGE-DEFINITION package specification EXCHANGE-DEFINITION
365	7.37 ALTERNATE-DATA-BUS package specification ALTERNATE-DATA-BUS
366	7.38 DC-DATA-BUS-EXCHANGE package specification
367	7.39 ABBET-EVALUATIONS package specification
369	7.40 VIRTU&-RESOURCE-GROVP package specification
370	7.41 ABBET-TEST-CAPSULE package specification ABBET-TEST-CAPSULE
371	7.42 ATLAS-CONTROL package specification
372	Annex A Test program examples
373	A.l Supported NOUNS-MODIFIERS-AND-CONNECTIONS package specification
378	A.2 ALTPI analog TPS example
379	A.2.1 ANALOG-TEST-OTHER-UNITS package
380	A.2.2 TEST-CONNECTIONS package
382	A.2.3 ANALOG-TEsT-CAPABILITIES package
384	A.2.4 ANALOG-TEST-RESOURCES package
387	A.2.6 ANALOG-TEST Procedure
389	A.2.7 ANALOG-TEST-CAPSULE package
391	A.2.8 CAPSULE-EXECUTION Procedure
392	A.3 ALTPI Digital TPS Example A.3.1 XMITRCV package
396	A.4 ALTPI noun modifier extension TPS example A.4.1 VACSENCP package A.4.2 VACUUT package
397	A.4.3 VACTEST package
398	ATE device-todevice connection extension example
400	Annex B Standard package file organization
402	Index to ABBET Ada identitiers

Additional information

Standard Title	IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))
Published Code	IEEE
Publication Date	1994
Pages Count	426

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IEEE 1226.2 1994

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