IEEE 1620-2008
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IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
| Published By | Publication Date | Number of Pages |
| IEEE | 2008 | 27 |
Revision Standard – Inactive-Reserved. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.
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