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IEEE IEC 61671 2 2016

$39.00

IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description

Published By Publication Date Number of Pages
IEEE 2016 56
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– Active. An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).

PDF Catalog

PDF Pages PDF Title
1 IEC 61671-2-2016, IEC Adoption of IEEE Std 1671.2-2012 Front Cover
4 CONTENTS
5 FOREWORD
9 INTRODUCTION
13 Important Notice
1. Overview
1.1 General
14 1.2 Application of this document’s annexes
1.3 Scope
1.4 Application
15 1.5 Conventions used within this document
16 2. Normative references
3. Definitions, abbreviations, and acronyms
3.1 Definitions
17 3.2 Abbreviations and acronyms
19 4. InstrumentDescription schema
4.1 General
4.2 Elements
22 4.3 Child elements
25 4.4 Complex types
40 4.5 Simple types
5. InstrumentDescription instance schema
5.1 Elements
41 5.2 Complex types
43 5.3 Simple types
6. ATML InstrumentDescription XML schema names and locations
45 7. ATML XML schema extensibility
8. Conformance
46 Annex A (informative) IEEE download Web site material associated with this document
47 Annex B (informative)
Users information and examples
B.1 Usage within an automatic test station
48 B.2 Instruments with calibration, capabilities, or triggering
B.3 Instrument options
B.4 Capabilities
49 B.5 Pins, ports, and connectors
B.6 Specifications represented by graphs
B.7 Parallel measurements (traces)
50 Annex C (informative) Glossary
51 Annex D (informative)
Bibliography
53 Annex E (informative) IEEE List of Participants
IEEE IEC 61671 2 2016
$39.00