{"id":141125,"date":"2024-10-19T08:12:06","date_gmt":"2024-10-19T08:12:06","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e1127-5\/"},"modified":"2024-10-25T00:25:09","modified_gmt":"2024-10-25T00:25:09","slug":"astm-e1127-5","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e1127-5\/","title":{"rendered":"ASTM-E1127"},"content":{"rendered":"<h3>ASTM E1127-08-Reapproved2015<\/h3>\n<h4>Withdrawn Standard: Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)<\/h4>\n<div>\n<h4>ASTM E1127<\/h4>\n<p><strong>Scope<\/strong><\/p>\n<div class=\"SectionLevel2\">\n<p class=\"subsec1 cdone2\"><span class=\"Head3 cdone\">1.1<\/span>&nbsp;This guide covers procedures used for depth profiling in Auger electron spectroscopy.<\/p>\n<\/p><\/div>\n<div class=\"SectionLevel2\">\n<p class=\"subsec1 cdone2\"><span class=\"Head3 cdone\">1.2<\/span>&nbsp;Guidelines are given for depth profiling by the following:<\/p>\n<div class=\"ParaCenter\">\n  <\/div>\n<\/p><\/div>\n<div class=\"SectionLevel2\">\n<p class=\"subsec1 cdone2\"><span class=\"Head3 cdone\">1.3<\/span>&nbsp;The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.<\/p>\n<\/p><\/div>\n<div class=\"SectionLevel2\">\n<p class=\"caveat cdone2\"><span class=\"Head3 cdone\">1.4<\/span>&nbsp;<i>This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/i><\/p>\n<\/p><\/div>\n<p><strong>Keywords<\/strong><\/p>\n<p>angle lapping; angle-resolved AES; Auger electron spectroscopy; ball cratering; compositional depth profiling; cross sectioning; depth profiling; depth resolution; sputter depth profiling; sputtering; thin films;<\/p>\n<p><strong>ICS Code<\/strong><\/p>\n<p>ICS Number Code 71.040.50 (Physicochemical methods of analysis)<\/p>\n<p><strong>DOI:<\/strong> 10.1520\/E1127-08R15<\/p>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p><b>E1127-08(2015) Standard Guide for Depth Profiling in Auger Electron Spectroscopy<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/astm\/\"><b>ASTM<\/b><\/a><\/td>\n<td>2015<\/td>\n<td>5<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":141128,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1001,2637],"product_tag":[],"class_list":{"0":"post-141125","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-50","7":"product_cat-astm","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/141125","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/141128"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=141125"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=141125"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=141125"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}