{"id":410010,"date":"2024-10-20T05:38:23","date_gmt":"2024-10-20T05:38:23","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-246882022\/"},"modified":"2024-10-26T10:22:00","modified_gmt":"2024-10-26T10:22:00","slug":"bs-iso-246882022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-246882022\/","title":{"rendered":"BS ISO 24688:2022"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Substrate conditions 5 Testing of modulation period 5.1 Principle for low-angle X-ray methods 5.1.1 General 5.1.2 XRR method <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5.1.3 GIXRD method <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5.1.4 Calculating formula <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5.2 Specifications concerning the coated sample 5.2.1 Size specifications for the coated sample 5.2.2 Periods specifications for the coated sample 5.2.3 Surface roughness requirements of the coated sample <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 5.3 Specifications for X-ray measuring apparatus 5.3.1 Apparatus configuration 5.3.2 Beam conversion device 5.3.3 Radiation sources and filters 5.4 Calibrating of apparatus <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5.5 Testing conditions 5.6 Test and calculation procedure <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Annex A (informative) Process of determination of modulation period by XRR <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods<\/b><\/p>\n |