{"id":247431,"date":"2024-10-19T16:17:07","date_gmt":"2024-10-19T16:17:07","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-61290-4-12011\/"},"modified":"2024-10-25T11:24:05","modified_gmt":"2024-10-25T11:24:05","slug":"bs-en-61290-4-12011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-61290-4-12011\/","title":{"rendered":"BS EN 61290-4-1:2011"},"content":{"rendered":"
This part of IEC 61290-4 applies to erbium-doped fibre amplifiers (EDFAs) and optically amplified elementary sub-systems. It applies to OAs using active fibres (optical fibre amplifiers, OFAs), containing rare-earth dopants. These amplifiers are commercially available and widely deployed in service provider networks.<\/p>\n
The object of this part of IEC 61290-4 is to provide the general background for EDFA transients and related parameters, and to describe a standard test method for accurate and reliable measurement of the following transient parameters:<\/p>\n
Channel addition\/removal transient gain overshoot and transient net gain overshoot<\/p>\n<\/li>\n
Channel addition\/removal transient gain undershoot and transient net gain undershoot<\/p>\n<\/li>\n
Channel addition\/removal gain offset<\/p>\n<\/li>\n
Channel addition\/removal transient gain response time constant (settling time)<\/p>\n<\/li>\n<\/ul>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | English \n CONTENTS <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 1 Scope and object 2 Normative references 3 Terms, definitions and abbreviations 3.1 General <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Figures \n Figure 1 \u2013 Definitions of rise and fall times (a) in the case of a channel addition event, and (b) in the case of a channel removal event <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Figure 2 \u2013 OFA transient gain response for (a) a channel removal event,and (b) a channel addition event <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3.2 Terms and definitions <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3.3 Abbreviated terms <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 4 Apparatus 5 Test specimen 6 Procedure Figure 3 \u2013 Generic transient control measurement setup <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 7 Calculations 8 Test results Tables \n Table 1 \u2013 Examples of add and drop scenarios for transient control measurement Table 2 \u2013 Typical results of transient control measurement <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Annex A (informative) Background on transient phenomenon in optical amplifiers \n <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Figure A.1 \u2013 EDFA pump control for a chain of 5 EDFAs and 4 fibre spans <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Figure A.2 \u2013 EDFA spectral hole depth for different gain compression Figure A.3 \u2013 EDFA spectral hole depth for different wavelengths <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Annex B (informative) Slew rate effect on transient gain response \n <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Figure B.1 \u2013 Transient gain response at various slew rates Table B.1 \u2013 Transient gain response for various rise time and fall time (16\u00a0dB add\/drop) <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Figure B.2 \u2013 16 dB add\/drop (rise time = 10 usec) \n Figure B.3 \u2013 16 dB add\/drop (rise time = 1 000 usec \n) <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Optical amplifiers. Test methods – Gain transient parameters. Two-wavelength method<\/b><\/p>\n |